Arwin, Hans

Linköping University

1 paper on CoChatORCID 0000-0001-9229-2028

Most cited papers

Verified
Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates
Jin, G., Jansson, R., & Arwin, H. (1996) · Review of Scientific Instruments
Optical Polarization and EllipsometryElectron and X-Ray Spectroscopy Techniques
Cited by 195

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