McPherson, J.W.

Time dependent dielectric breakdown physics – Models revisited

McPherson, J. W. (2012) · Microelectronics Reliability

Semiconductor materials and devicesCopper Interconnects and Reliability

Cited by 268

Brief history of JEDEC qualification standards for silicon technology and their applicability(?) to WBG semiconductors

McPherson, J. W. (2018) · 2018 IEEE International Reliability Physics Symposium (IRPS)

Silicon Carbide Semiconductor TechnologiesIntegrated Circuits and Semiconductor Failure Analysis

Cited by 24