Fenger, Germain
Siemens (United States)
2 papers on CoChatORCID 0000-0003-2448-0056
Most cited papers
- Verified
Mask 3D effects and compensation for high NA EUV lithography
Raghunathan, S., McIntyre, G., Fenger, G., & Wood, O. (2013) · SPIE Proceedings
Advancements in Photolithography TechniquesAdvanced optical system design
Cited by 27
- Verified
GPU-Accelerated Feature Extraction for Real-Time Vision AI and LLM Systems Efficiency: Autonomous Image Segmentation, Unsupervised Clustering, and Smart Pattern Recognition for Scalable AI Processing with 6.6× Faster Performance, 2.5× Higher Accuracy, and UX-Centric UI Boosting Human-in-the-Loop Productivity
Ahi, K., Wu, S., Sriram, S., & Fenger, G. (2025) · 2025 36th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
Parallel Computing and Optimization TechniquesAdvanced Neural Network Applications
Cited by 4
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