Wei, Taoran

A simulation-based few samples learning method for surface defect segmentation

Wei, T., Cao, D., Zheng, C., & Yang, Q. (2020) · Neurocomputing

Industrial Vision Systems and Defect DetectionInfrastructure Maintenance and Monitoring

Cited by 21

Defective samples simulation through neural style transfer for automatic surface defect segment

Wei, T., Cao, D., Jiang, X., Zheng, C., & Liu, L. (2020) · 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems

Industrial Vision Systems and Defect DetectionGenerative Adversarial Networks and Image Synthesis

Cited by 10