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Microscopical Investigations of PEDOT:PSS Thin Films
Abstract
Electron microscopy studies are used to explore the morphology of thin poly(3,4‐ethylenedioxythiophene) and polystyrene sulfonate acid (PEDOT:PSS) films. The figures show that the films are composed of grains with diameters in the range of about 50 nm. Energy dispersive X‐ray spectroscopy analysis reveals that individual grains have a PEDOT‐rich core and a PSS‐rich shell with a thickness of about 5–10 nm. Atomic force microscopy (AFM) is then used to analyze the topography of fracture surfaces of ruptured PEDOT:PSS tensile specimens. These AFM scans also show that the films are composed of grains dispersed in a matrix. The investigations presented herein yield a picture of PEDOT:PSS morphology with unprecedented clarity.
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Cited by
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Structural control of mixed ionic and electronic transport in conducting polymers
Rivnay, J., Inal, S., Collins, B. A., Sessolo, M., Stavrinidou, E., Strakosas, X., Tassone, C., Delongchamp, D. M., & Malliaras, G. G. (2016) · Nature Communications · doi:10.1038/ncomms11287 · Cited by 939
PEDOT Nanocrystal in Highly Conductive PEDOT:PSS Polymer Films
Takano, T., Masunaga, H., Fujiwara, A., Okuzaki, H., & Sasaki, T. (2012) · Macromolecules · doi:10.1021/ma300120g · Cited by 426
Alemu Mengistie, D., Wang, P.-C., & Chu, C.-W. (2013) · Journal of Materials Chemistry A · doi:10.1039/c3ta11726j · Cited by 316
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Metadata
- Authors
- Lang, U., Müller, E., Naujoks, N., & Dual, J.
- Venue
- Advanced Functional Materials
- Publisher
- Wiley
- Published
- 2009-04-20
- Volume
- 19
- Issue
- 8
- Pages
- 1215-1220
- ISSN
- 1616-301X (ISSN-L)
- 1616-3028
- OpenAlex
- W2145763539
- Cited by
- 457
- References
- 0
- FWCI
- 12.82
- Type
- journal article
- Language
- en
- Open access
- closed
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