The DOI matches its Crossref record.
Scanning optical microscopy
Abstract
The scanning optical microscope, provides new information about a wide variety of specimens. The confocal mode provides a form of super‐resolution and allows the depth of field of the microscope to be tuned at will, and extended, in principle, without limit. The instrument is particularly advantageous for the study of materials and devices, especially semiconductors. The image is built up on a cathode ray tube display by mechanically scanning the object across a focussed spot.
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“A detection numerical aperture (NA) of 0.6 is used; lower NA values do not sufficiently resolve signals from adjacent voxels, whereas higher NA values introduce more significant spherical aberration with depth34–36.”
From Laser writing in glass for dense, fast and efficient archival data storage (2026) · cites this paper as [34]
Citations
Cites
Still being checked.
Research works printed but not linked: 7
Cited by
Laser writing in glass for dense, fast and efficient archival data storage
Microsoft Research Project Silica Team, Allison, J., Anderson, P., Aranas, E., Assaf, Y., Black, R., Caballero, M., Canakci, B., Chattaway, J. A., Chatzieleftheriou, A., et al. (2026) · Nature · doi:10.1038/s41586-025-10042-w · Cited by 25
Metadata
- Authors
- Wilson, T.
- Affiliations
- University of Oxford (GB)
- Corresponding author
- Wilson, T.
- Venue
- Scanning
- Publisher
- Wiley
- Published
- 1985-01
- Volume
- 7
- Issue
- 2
- Pages
- 79-87
- ISSN
- 0161-0457 (ISSN-L)
- 1932-8745
- OpenAlex
- W2156199518
- Cited by
- 87
- References
- 0
- Citations by year
- 2025: 2 · 2024: 1 · 2023: 1 · 2017: 1 · 2014: 2 · 2013: 1
- FWCI
- 2.26
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Scanning (publishedVersion)
- Topics
- Life Sciences › Biochemistry, Genetics and Molecular Biology › Biophysics › Advanced Fluorescence Microscopy Techniques
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Near-Field Optical Microscopy
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Advanced optical system design
- Keywords
- scanning optical microscope, confocal microscopy, super-resolution, depth of field, CRT display, mechanical scanning, semiconductors
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.