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Near‐Edge X‐ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials
Abstract
We have demonstrated near‐edge X‐ray absorption fine structure (NEXAFS) spectroscopy as a particularly useful and effective technique for simultaneously probing the surface chemistry, surface molecular orientation, degree of order, and electronic structure of carbon nanotubes and related nanomaterials. Specifically, we employ NEXAFS in the study of single‐walled carbon nanotube and multi‐walled carbon nanotube powders, films, and arrays, as well as of boron nitride nanotubes. We have focused on the advantages of NEXAFS as an exciting, complementary tool to conventional microscopy and spectroscopy for providing chemical and structural information about nanoscale samples.
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Cited by
Charge Transfer in the MoS2/Carbon Nanotube Composite
Koroteev, V. O., Bulusheva, L. G., Asanov, I. P., Shlyakhova, E. V., Vyalikh, D. V., & Okotrub, A. V. (2011) · The Journal of Physical Chemistry C · doi:10.1021/jp205939e · Cited by 286
Lee, V., Whittaker, L., Jaye, C., Baroudi, K. M., Fischer, D. A., & Banerjee, S. (2009) · Chemistry of Materials · doi:10.1021/cm901554p · Cited by 278
Self-citationCharacterization of partially reduced graphene oxide as room temperature sensor for H2
Zhang, L.-S., Wang, W. D., Liang, X.-Q., Chu, W.-S., Song, W.-G., Wang, W., & Wu, Z.-Y. (2011) · Nanoscale · doi:10.1039/c1nr10187k · Cited by 77
Metadata
- Authors
- Hemraj‐Benny, T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, D. A., Eres, G., Puretzky, A. A., Geohegan, D. B., Lowndes, D. H., Han, W., Misewich, J. A., & Wong, S. S.
- Venue
- Small
- Publisher
- Wiley
- Published
- 2005-12-05
- Volume
- 2
- Issue
- 1
- Pages
- 26-35
- ISSN
- 1613-6810 (ISSN-L)
- 1613-6829
- OpenAlex
- W2051143007
- Cited by
- 178
- References
- 0
- FWCI
- 5.36
- Type
- journal article
- Language
- en
- Open access
- closed
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- Hemraj‐Benny, T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, D. A., Eres, G., Puretzky, A. A., Geohegan, D. B., Lowndes, D. H., Han, W., Misewich, J. A., & Wong, S. S. (2006). Near‐Edge X‐ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials. Small. https://doi.org/10.1002/smll.200500256
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