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Cited by 1,521

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Nanoscale Forces and Their Uses in Self‐Assembly

Bishop, Kyle J. M., Wilmer, Christopher E., Soh, Siowling, Grzybowski, Bartosz A.·2009·Small

Abstract

The ability to assemble nanoscopic components into larger structures and materials depends crucially on the ability to understand in quantitative detail and subsequently “engineer” the interparticle interactions. This Review provides a critical examination of the various interparticle forces (van der Waals, electrostatic, magnetic, molecular, and entropic) that can be used in nanoscale self‐assembly. For each type of interaction, the magnitude and the length scale are discussed, as well as the scaling with particle size and interparticle distance. In all cases, the discussion emphasizes characteristics unique to the nanoscale. These theoretical considerations are accompanied by examples of recent experimental systems, in which specific interaction types were used to drive nanoscopic self‐assembly. Overall, this Review aims to provide a comprehensive yet easily accessible resource of nanoscale‐specific interparticle forces that can be implemented in models or simulations of self‐assembly processes at this scale. magnified image

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Crossref · 10.1002/smll.200900358

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Metadata

Authors
Bishop, K. J. M., Wilmer, C. E., Soh, S., & Grzybowski, B. A.
Venue
Small
Publisher
Wiley
Published
2009-07-17
Volume
5
Issue
14
Pages
1600-1630
ISSN
  • 1613-6810 (ISSN-L)
  • 1613-6829
OpenAlex
W2133934213
Cited by
1,521
References
3
FWCI
37.60
Type
journal article
Language
en
Open access
closed

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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