The DOI matches its Crossref record; 13 of the 13 references it cites were found in a registry or an index.
Negative Margin Matters: Understanding Margin in Few-Shot Classification
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Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
ImageNet: A large-scale hierarchical image database
Deng, J., Dong, W., Socher, R., Li, L.-J., Li, K., & Fei-Fei, L. (2009) · 2009 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2009.5206848 · Cited by 65,333
Rethinking the Inception Architecture for Computer Vision
Szegedy, C., Vanhoucke, V., Ioffe, S., Shlens, J., & Wojna, Z. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.308 · Cited by 32,138
FaceNet: A unified embedding for face recognition and clustering
Schroff, F., Kalenichenko, D., & Philbin, J. (2015) · 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2015.7298682 · Cited by 15,267
Quo Vadis, Action Recognition? A New Model and the Kinetics Dataset
Carreira, J., & Zisserman, A. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.502 · Cited by 9,570
Model-Agnostic Meta-Learning for Fast Adaptation of Deep Networks
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ArcFace: Additive Angular Margin Loss for Deep Face Recognition
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Deformable Convolutional Networks
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Self-citationZagoruyko, S., & Komodakis, N. (2016) · Procedings of the British Machine Vision Conference 2016 · doi:10.5244/c.30.87 · Cited by 7,244
Cited by
A Comprehensive Survey of Few-shot Learning: Evolution, Applications, Challenges, and Opportunities
Song, Y., Wang, T., Cai, P., Mondal, S. K., & Sahoo, J. P. (2023) · ACM Computing Surveys · doi:10.1145/3582688 · Cited by 721
Deep metric learning for few-shot image classification: A Review of recent developments
Li, X., Yang, X., Ma, Z., & Xue, J.-H. (2023) · Pattern Recognition · doi:10.1016/j.patcog.2023.109381 · Cited by 243
(2020) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-58548-8 · Cited by 66
Multimodal Parameter-Efficient Few-Shot Class Incremental Learning
D’Alessandro, M., Alonso, A., Calabrés, E., & Galar, M. (2023) · 2023 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) · doi:10.1109/iccvw60793.2023.00364 · Cited by 40
Metadata
- Authors
- Liu, B., Cao, Y., Lin, Y., Li, Q., Zhang, Z., Long, M., & Hu, H.
- Venue
- Lecture Notes in Computer Science
- Publisher
- Springer International Publishing
- Published
- 2020
- Pages
- 438-455
- ISSN
- 0302-9743 (ISSN-L)
- 1611-3349
- OpenAlex
- W3096805028
- Cited by
- 350
- References
- 13
- FWCI
- 22.27
- Type
- conference paper
- Language
- en
- Open access
- green
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- Liu, B., Cao, Y., Lin, Y., Li, Q., Zhang, Z., Long, M., & Hu, H. (2020). Negative Margin Matters: Understanding Margin in Few-Shot Classification. Lecture Notes in Computer Science. https://doi.org/10.1007/978-3-030-58548-8_26
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