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A Deeper Look at Dataset Bias
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Metadata
- Authors
- Tommasi, T., Patricia, N., Caputo, B., & Tuytelaars, T.
- Affiliations
- Sapienza University of Rome (IT)
- École Polytechnique Fédérale de Lausanne (CH)
- IMEC (BE)
- Corresponding author
- Tommasi, Tatiana
- Venue
- Advances in Computer Vision and Pattern Recognition
- Publisher
- Springer International Publishing
- Published
- 2017
- Pages
- 37-55
- ISSN
- 2191-6586 (ISSN-L)
- 2191-6594
- OpenAlex
- W2757251151
- Cited by
- 245
- References
- 0
- Citations by year
- 2026: 7 · 2025: 16 · 2024: 24 · 2023: 35 · 2022: 38 · 2021: 43 · 2020: 32 · 2019: 37 · 2018: 11 · 2017: 2
- FWCI
- 46.72
- Type
- book chapter
- Language
- en
- Open access
- green
- hdl.handle.net
- Locations
- Advances in computer vision and pattern recognition (publishedVersion)
- IRIS Research product catalog (Sapienza University of Rome) (submittedVersion)
- PORTO@Iris (submittedVersion)
- Lirias (KU Leuven) (submittedVersion)
- Topics
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
- Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Image and Video Retrieval Techniques
- Keywords
- data bias, cross-dataset generalization, convolutional neural network features, image database, data alignment, image descriptors
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