The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
A review of high-temperature electronics technology and applications
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Physics of Semiconductor Devices
Sze, S. M., & Ng, K. K. (2006) · doi:10.1002/0470068329 · Cited by 14,627
Cited by
A Review of SiC Power Module Packaging Technologies: Challenges, Advances, and Emerging Issues
Lee, H., Smet, V., & Tummala, R. (2020) · IEEE Journal of Emerging and Selected Topics in Power Electronics · doi:10.1109/jestpe.2019.2951801 · Cited by 526
Polymer Capacitor Dielectrics for High Temperature Applications
Ho, J. S., & Greenbaum, S. G. (2018) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.8b07705 · Cited by 404
Metadata
- Authors
- Watson, J., & Castro, G.
- Venue
- Journal of Materials Science: Materials in Electronics
- Published
- 2015-07-17
- Volume
- 26
- Issue
- 12
- Pages
- 9226-9235
- ISSN
- 0957-4522 (ISSN-L)
- 1573-482X
- OpenAlex
- W2180571009
- Cited by
- 378
- References
- 1
- FWCI
- 7.06
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: A review of high-temperature electronics technology and applications. https://app.cochat.ai/papers/10.1007/s10854-015-3459-4
- The paper
- Watson, J., & Castro, G. (2015). A review of high-temperature electronics technology and applications. Journal of Materials Science: Materials in Electronics. https://doi.org/10.1007/s10854-015-3459-4
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
