The DOI matches its Crossref record; 13 of the 13 references it cites were found in a registry or an index.
Isotopic fractionation of negative ions produced by Cs sputtering in a high-intensity source
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In the citing paper
“Although few studies on negative ion-source and spectrometer-induced isotopic fractionation are available (Middleton et al. 1994 and references therein; Quarta et al. 2004), they suggest that severe isotopic fractionation (~10%) is expected during AMS measurements.”
From Blank Assessment for Ultra-Small Radiocarbon Samples: Chemical Extraction and Separation Versus AMS (2010) · cites this paper as Middleton et al. 1994
Citations
Cites
Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets
Sigmund, P. (1969) · Physical Review · doi:10.1103/physrev.184.383 · Cited by 3,589
Sigmund, P. (1969) · Cited by 1,964
II. The energy spectrum of ejected atoms during the high energy sputtering of gold
Thompson, M. W. (1968) · Philosophical Magazine · doi:10.1080/14786436808227358 · Cited by 1,198
Secondary-ion emission probability in sputtering
Nørskov, J. K., & Lundqvist, B. I. (1979) · Physical review. B, Condensed matter · doi:10.1103/physrevb.19.5661 · Cited by 383
A versatile high intensity negative ion source
Middleton, R. (1983) · Nuclear Instruments and Methods in Physics Research · doi:10.1016/0167-5087(83)90580-x · Cited by 212
Self-citationIsotope fractionation in secondary ion mass spectrometry
Nobumichi Shimizu, B., & Hart, S. R. (1982) · Journal of Applied Physics · doi:10.1063/1.330636 · Cited by 167
Secondary Ion Mass Spectrometry SIMS IV
Benninghoven, A., Okano, J., Shimizu, R., & Werner, H. W. (1984) · Springer series in chemical physics · doi:10.1007/978-3-642-82256-8 · Cited by 113
On 10Be standards and the half-life of 10Be
Middleton, R., Brown, L., Dezfouly-Arjomandy, B., & Klein, J. (1993) · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · doi:10.1016/0168-583x(93)95987-g · Cited by 93
Self-citationVelocity dependence of secondary-ion emission
VASILE, M. J. (1984) · Physical review. B, Condensed matter · doi:10.1103/physrevb.29.3785 · Cited by 90
Secondary Ion Mass Spectrometry
Williams, P. (1983) · Condensed Matter · doi:10.1016/b978-0-12-478804-6.50013-7 · Cited by 89
Research works printed but not linked: 2
- Litherland, 1987, Phil. Trans. R. Soc. London, A 323, 5
- Havette, 1981, J. Micros. Spectrosc. Electron., 6, 169
Cited by
Blank Assessment for Ultra-Small Radiocarbon Samples: Chemical Extraction and Separation Versus AMS
Santos, G. M., Southon, J. R., Drenzek, N. J., Ziolkowski, L. A., Druffel, E., Xu, X., Zhang, D., Trumbore, S., Eglinton, T. I., & Hughen, K. A. (2010) · Radiocarbon · doi:10.1017/s0033822200046415 · Cited by 103
Metadata
- Authors
- Middleton, R., Juenemann, D., & Klein, J.
- Affiliations
- University of Pennsylvania (US)
- Venue
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Publisher
- Elsevier BV
- Published
- 1994-07
- Volume
- 93
- Issue
- 1
- Pages
- 39-51
- ISSN
- 0168-583X (ISSN-L)
- OpenAlex
- W1994050721
- Cited by
- 15
- References
- 13
- Citations by year
- 2022: 1 · 2021: 1 · 2017: 1 · 2016: 2 · 2015: 1 · 2012: 2
- FWCI
- 0.94
- Type
- journal article
- Language
- en
- Open access
- closed
- Licence
- www.elsevier.com/tdm/userlicense/1.0/ (tdm)
- www.elsevier.com/legal/tdmrep-license (tdm)
- Locations
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Surfaces, Coatings and Films › Ion-surface interactions and analysis
- Physical Sciences › Physics and Astronomy › Nuclear and High Energy Physics › Particle accelerators and beam dynamics
- Physical Sciences › Chemistry › Spectroscopy › Mass Spectrometry Techniques and Applications
- Keywords
- isotope fractionation, negative ions, cesium sputtering, atomic negative ions, negative molecular ions, molecular beams, atomic beam, lithium, iridium
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
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How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Isotopic fractionation of negative ions produced by Cs sputtering in a high-intensity source. https://app.cochat.ai/papers/10.1016/0168-583x(94)95455-0
- The paper
- Middleton, R., Juenemann, D., & Klein, J. (1994). Isotopic fractionation of negative ions produced by Cs sputtering in a high-intensity source. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. https://doi.org/10.1016/0168-583x(94)95455-0
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
