The DOI matches its Crossref record; 13 of the 13 references it cites were found in a registry or an index.
Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Handbook of X-Ray Photoelectron Spectroscopy
Moulder, J. F. (1995) · Medical Entomology and Zoology · Cited by 23,662
Handbook of chemistry and physics
(1930) · Journal of the Franklin Institute · doi:10.1016/s0016-0032(30)91499-8 · Cited by 11,721
(1994) · Vacuum · doi:10.1016/0042-207x(94)90087-6 · Cited by 3,332
Handbook of Chemistry and Physics.
(1973) · Annals of Internal Medicine · doi:10.7326/0003-4819-79-6-934_3 · Cited by 2,559
McCafferty, E., & Wightman, J. P. (1998) · Surface and Interface Analysis · doi:10.1002/(sici)1096-9918(199807)26:8<549::aid-sia396>3.0.co;2-q · Cited by 925
Low-Energy Electrons and Surface Chemistry
Ertl, G., Küppers, J., & Park, R. L. (1976) · Physics Today · doi:10.1063/1.3023372 · Cited by 770
Core and valence level photoemission studies of iron oxide surfaces and the oxidation of iron
Brundle, C. R., Chuang, T. J., & Wandelt, K. (1977) · Surface Science · doi:10.1016/0039-6028(77)90239-4 · Cited by 653
Graat, P. C. J., & Somers, M. A. J. (1996) · Applied Surface Science · doi:10.1016/0169-4332(96)00252-8 · Cited by 594
Lin, T.-C., Seshadri, G., & Kelber, J. A. (1997) · Applied Surface Science · doi:10.1016/s0169-4332(97)00167-0 · Cited by 355
XPS: binding energy calibration of electron spectrometers 5?re-evaluation of the reference energies
Seah, M. P., Gilmore, I. S., & Beamson, G. (1998) · Surface and Interface Analysis · doi:10.1002/(sici)1096-9918(199808)26:9<642::aid-sia408>3.0.co;2-3 · Cited by 291
Cited by
Luo, J., Liu, J., Zeng, Z., Ng, C. F., Ma, L., Zhang, H., Lin, J., Shen, Z., & Fan, H. J. (2013) · Nano Letters · doi:10.1021/nl403461n · Cited by 773
Metalworking fluids—Mechanisms and performance
Brinksmeier, E., Meyer, D., Huesmann-Cordes, A. G., & Herrmann, C. (2015) · CIRP Annals · doi:10.1016/j.cirp.2015.05.003 · Cited by 403
Xu, J., Avellan, A., Li, H., Liu, X., Noël, V., Lou, Z., Wang, Y., Kaegi, R., Henkelman, G., & Lowry, G. V. (2020) · Advanced Materials · doi:10.1002/adma.201906910 · Cited by 389
Li, X., Cui, K., Guo, Z., Yang, T., Cao, Y., Xiang, Y., Chen, H., & Xi, M. (2020) · Chemical Engineering Journal · doi:10.1016/j.cej.2019.122324 · Cited by 308
Zhong, D., Zhang, Y., Wang, L., Chen, J., Jiang, Y., Tsang, D. C. W., Zhao, Z., Ren, S., Liu, Z., & Crittenden, J. C. (2018) · Environmental Pollution · doi:10.1016/j.envpol.2018.08.093 · Cited by 214
Metadata
- Authors
- Bhargava, G., Gouzman, I., Chun, C. M., Ramanarayanan, T. A., & Bernasek, S. L.
- Venue
- Applied Surface Science
- Publisher
- Elsevier BV
- Published
- 2007-02
- Volume
- 253
- Issue
- 9
- Pages
- 4322-4329
- ISSN
- 0169-4332 (ISSN-L)
- OpenAlex
- W2099778114
- Cited by
- 388
- References
- 13
- FWCI
- 3.51
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study. https://app.cochat.ai/papers/10.1016/j.apsusc.2006.09.047
- The paper
- Bhargava, G., Gouzman, I., Chun, C. M., Ramanarayanan, T. A., & Bernasek, S. L. (2007). Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study. Applied Surface Science. https://doi.org/10.1016/j.apsusc.2006.09.047
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
