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Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
Open accessAbstract
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly determine the thickness of individual FLG films. However, reports from literature show a large variation of the measured thickness of graphene layers. This paper is focused on the imaging mechanism of tapping mode AFM (TAFM) when measuring graphene and FLG thickness, and we show that at certain measurement parameters significant deviations can be introduced in the measured thickness of FLG flakes. An increase of as much as 1 nm can be observed in the measured height of FLG crystallites, when using an improperly chosen range of free amplitude values of the tapping cantilever. We present comparative Raman spectroscopy and TAFM measurements on selected single and multilayer graphene films, based on which we suggest ways to correctly measure graphene and FLG thickness using TAFM.
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Cites
Two-dimensional gas of massless Dirac fermions in graphene
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Katsnelson, M. I., Grigorieva, I. V., Dubonos, S. V., & Firsov, A. A. (2005) · Nature · doi:10.1038/nature04233 · Cited by 21,611
Two-dimensional atomic crystals
Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V., & Geim, A. K. (2005) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0502848102 · Cited by 11,788
Cited by
Progress, Challenges, and Opportunities in Two-Dimensional Materials Beyond Graphene
Butler, S. Z., Hollen, S. M., Cao, L., Cui, Y., Gupta, J. A., Gutiérrez, H. R., Heinz, T. F., Hong, S. S., Huang, J., Ismach, A. F., et al. (2013) · ACS Nano · doi:10.1021/nn400280c · Cited by 4,878
Anomalous Lattice Vibrations of Single- and Few-Layer MoS2
Lee, C., Yan, H., Brus, L. E., Heinz, T. F., Hone, J., & Ryu, S. (2010) · ACS Nano · doi:10.1021/nn1003937 · Cited by 4,859
Recent advances in graphene based polymer composites
Kuilla, T., Bhadra, S., Yao, D., Kim, N. H., Bose, S., & Lee, J. H. (2010) · Progress in Polymer Science · doi:10.1016/j.progpolymsci.2010.07.005 · Cited by 3,406
Konicki, W., Aleksandrzak, M., Moszyński, D., & Mijowska, E. (2017) · Journal of Colloid and Interface Science · doi:10.1016/j.jcis.2017.02.031 · Cited by 435
Scalable production of graphene sheets by mechanical delamination
Knieke, C., Berger, A., Voigt, M., Taylor, R. N. K., Röhrl, J., & Peukert, W. (2010) · Carbon · doi:10.1016/j.carbon.2010.05.003 · Cited by 243
Metadata
- Authors
- Nemes-Incze, P., Osváth, Z., Kamarás, K., & Biró, L. P.
- Venue
- Carbon
- Publisher
- Elsevier BV
- Published
- 2008-09
- Volume
- 46
- Issue
- 11
- Pages
- 1435-1442
- ISSN
- 0008-6223 (ISSN-L)
- OpenAlex
- W2164856334
- Cited by
- 607
- References
- 2
- FWCI
- 13.73
- Type
- journal article
- Language
- en
- Open access
- green
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- Nemes-Incze, P., Osváth, Z., Kamarás, K., & Biró, L. P. (2008). Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy. Carbon. https://doi.org/10.1016/j.carbon.2008.06.022
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