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Accuracy assessment of the global TanDEM-X Digital Elevation Model with GPS data

Wessel, Birgit, Huber, Martin, Wohlfart, Christian, Marschalk, Ursula, Kosmann, Detlev, Roth, Achim·2018·ISPRS Journal of Photogrammetry and Remote Sensing

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Crossref · 10.1016/j.isprsjprs.2018.02.017

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  • Slope has a greater influence than aspect on the vertical accuracy of DEMs.

    “These results suggest that slope has a greater influence than aspect on the vertical accuracy of DEMs, supporting the conclusions of previous studies [61,63].”

    From ANADEM: A Digital Terrain Model for South America (2024) · cites this paper as [63]

    Section 3.4 (page unavailable) reports higher RMSE, NMAD, and LE90 for TanDEM-X terrain with slopes above 10°, supporting an effect of slope on vertical accuracy. The paper does not compare slope with aspect, so it does not establish that slope has the greater influence. (LLM, conf=0.84)

    Experimental — accuracy not yet measured

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Research works printed but not linked: 25

  1. Baade, 2016, TanDEM-X IDEM precision and accuracy assessment based on a large assembly of differential GNSS measurements in Kruger National Park, South Africa, ISPRS J. Photogramm. Remote Sens., 119, 496, 10.1016/j.isprsjprs.2016.05.005 · DOI
  2. Bolkas, 2016, Assessing digital elevation model uncertainty using GPS survey data, J. Surv. Eng., 142, 10.1061/(ASCE)SU.1943-5428.0000169 · DOI
  3. Borla Tridon, 2013, TanDEM-X: DEM acquisition in the third year era, Int. J. Space Sci. Eng., 1, 367, 10.1504/IJSPACESE.2013.059270 · DOI
  4. Carabajal, 2005, ICESat validation of SRTM C-band digital elevation models, Geophys. Res. Lett., 32, L22S01, 10.1029/2005GL023957 · DOI · Paper page
  5. Gesch, 2012, Validation of the ASTER global digital elevation model version 2 over the conterminous United States, Int. Arch. Photogramm. Remote Sens. Spatial Inf. Sci., XXXIX-B4, 281, 10.5194/isprsarchives-XXXIX-B4-281-2012 · DOI · Paper page
  6. Gesch, 2016, Validation of the ASTER Global Digital Elevation Model version 3 over the conterminous United States, Int. Arch. Photogramm. Remote Sens. Spatial Inf. Sci., XLI-B4, 143, 10.5194/isprs-archives-XLI-B4-143-2016 · DOI
  7. Gonzalez, 2015, Relative height accuracy estimation method for InSAR-based DEMs, IEEE J. Sel. Top. Appl. Earth Obs. Remote Sens., 8, 5352, 10.1109/JSTARS.2015.2474159 · DOI
  8. Gruber, 2012, Operational TanDEM-X DEM calibration and first validation results, IEEE J. Sel. Top. Appl. Earth Obs. Remote Sens., 73, 39
  9. Gruber, 2016, The TanDEM-X DEM mosaicking: Fusion of multiple acquisitions using InSAR quality parameters, IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, 9, 1047, 10.1109/JSTARS.2015.2421879 · DOI
  10. Höhle, 2009, Accuracy assessment of digital elevation models by means of robust statistical methods, ISPRS J. Photogramm. Remote Sens., 64, 398, 10.1016/j.isprsjprs.2009.02.003 · DOI · Paper page
  11. Homer, 2015, Completion of the 2011 National Land Cover Database for the conterminous United States-Representing a decade of land cover change information, Photogramm. Eng. Remote Sens., 81, 345
  12. Huber, M., Wessel, B., Kosmann, D., Felbier, A., Schwieger, V., Habermeyer, M., Wendleder, A., Roth, A., 2009. Ensuring globally the TanDEM-X height accuracy: analysis of the reference data sets ICESat, SRTM, and KGPS-Tracks. Proceedings of IGARSS 2009, Cape Town, South Africa. · DOI
  13. Jacobsen, 2010, Analysis of ASTER GDEM elevation models, Int. Arch. Photogramm. Remote Sens., 38, 1
  14. Krieger, 2007, TanDEM-X: a satellite formation for high resolution SAR interferometry, IEEE Trans. Geosci. Remote Sens., 45, 3317, 10.1109/TGRS.2007.900693 · DOI
  15. Lachaise, 2018, The dual-baseline phase unwrapping correction framework for the TanDEM-X mission part1: Theoretical description and algorithms, IEEE Trans. Geosci. and Remote Sens., 56, 780, 10.1109/TGRS.2017.2754923 · DOI
  16. Maune, D.F. (Ed.), 2007. Digital Elevation Model Technologies and Applications: The DEM User Manual, second ed. ISBN: 1-57083-082-7.
  17. Mouratidis, 2010, SRTM 3″ DEM (versions 1, 2, 3, 4) validation by means of extensive kinematic GPS measurements: a case study from North Greece, Int. J. Remote Sens., 31, 6205, 10.1080/01431160903401403 · DOI
  18. Rexer, 2016, Evaluation of intermediate TanDEM-X digital elevation data products over Tasmania using other digital elevation models and accurate heights from the Australian National Gravity Database, Aust. J. Earth Sci., 63, 599, 10.1080/08120099.2016.1238440 · DOI
  19. Rizzoli, 2017, Generation and performance assessment of the global TanDEM-X Digital Elevation Model, ISPRS J. Photogramm. Remote Sens., 132, 119, 10.1016/j.isprsjprs.2017.08.008 · DOI
  20. Rodríguez, 2006, A global assessment of the SRTM performance, Photogramm. Eng. Remote Sens., 72, 249, 10.14358/PERS.72.3.249 · DOI · Paper page
  21. Schwieger, V., Schweitzer, J., Kosmann, D., 2009. GPS precise point positioning as a method to evaluate global TanDEM-X digital elevation model. VII FIG Regional Conference, Hanoi, Vietnam.
  22. Takaku, J., Tadono, T., Tsutsui, K., Ichikawa, M., 2016. Validation of ‘AW3D’ Global DSM generated from ALOS PRISM. Int. Ann. Photogramm. Remote Sens. Spatial Inf. Sci. III-4, 25–31. · DOI · Paper page
  23. Wessel, B., Marschalk, U., Gruber, A., Huber, M., Hahmann, T., Roth, A., Habermeyer, M., Kosmann, D., 2008. Design of the DEM Mosaicking and Calibration Processor for TanDEM-X. Proceedings of EUSAR 2008, Friedrichshafen, Germany, 4, 111–114.
  24. Zwally, 2002, ICESat’s laser measurements of polar, ice, atmosphere, ocean, and land, J. Geodyn., 34, 405, 10.1016/S0264-3707(02)00042-X · DOI
  25. Zink, 2014, TanDEM-X: the new global DEM takes shape, IEEE Geosci. Remote Sens. Mag., 2, 8, 10.1109/MGRS.2014.2318895 · DOI

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Metadata

Authors
Wessel, B., Huber, M., Wohlfart, C., Marschalk, U., Kosmann, D., & Roth, A.
Venue
ISPRS Journal of Photogrammetry and Remote Sensing
Publisher
Elsevier BV
Published
2018-05
Volume
139
Pages
171-182
ISSN
0924-2716
Cited by
361
References
0
Language
en
Funders
Bundesministerium für Wirtschaft und Technologie (50 EE 0601)

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