Design of metal interconnects for stretchable electronic circuits
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
The EA value of the twining electrodes is 0.08 N, while traditional silicone rubber- and PI-based extraneural electrodes have EA values of ~5000 and 40 N, respectively.
“By taking advantage of the mesh serpentine design (44–46), the EA value is greatly decreased to 0.08 N (fig. S8); comparatively, the EA values of traditional silicone rubber– and PI-based extraneural electrodes are ~5000 and 40 N, respectively (note S3).”
From Climbing-inspired twining electrodes using shape memory for peripheral nerve stimulation and recording (2019) · cites this paper as [44]
The applied stresses on the nerve and the reliability of the Au layer can be further improved by increasing the stretchability of the twining electrode.
“In addition, the applied stresses on the nerve and the reliability of the Au layer can be further improved by increasing the stretchability of the twining electrode according to previous works (44–47).”
From Climbing-inspired twining electrodes using shape memory for peripheral nerve stimulation and recording (2019) · cites this paper as [44]
The citation lists haven’t been fetched yet
References 13 · Cited by 405
- Authors
- Gonzalez, M., Axisa, F., Bulcke, M. V., Brosteaux, D., Vandevelde, B., & Vanfleteren, J.
- Affiliations
- IMEC (BE)
- Ghent University (BE)
- ORCID
- Vanfleteren, Jan
- Venue
- Microelectronics Reliability
- Publisher
- Elsevier BV
- Published
- 2008-06
- Volume
- 48
- Issue
- 6
- Pages
- 825-832
- ISSN
- 0026-2714 (ISSN-L)
- OpenAlex
- W2027719558
- Cited by
- 405
- References
- 13
- Citations by year
- 2026: 11 · 2025: 14 · 2024: 14 · 2023: 23 · 2022: 15 · 2021: 23 · 2020: 21 · 2019: 37 · 2018: 41 · 2017: 34 · 2016: 25 · 2015: 39 · 2014: 21 · 2013: 17 · 2012: 20
- FWCI
- 14.97
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Microelectronics Reliability (publishedVersion)
- Ghent University Academic Bibliography (Ghent University) (submittedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Nanomaterials and Printing Technologies
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Electronic Packaging and Soldering Technologies
- Physical Sciences › Engineering › Biomedical Engineering › Advanced Sensor and Energy Harvesting Materials
- Keywords
- stretchable electronics, metal interconnects, silicone substrate, flexible circuits, stress concentration, smart textiles, medical electronics
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
