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The DOI matches its Crossref record; 13 of the 13 references it cites were found in a registry or an index.

Mechanical problems of novel back contact solar modules

Kraemer, Frank, Wiese, Steffen, Peter, Erik, Seib, Jonas·2013·Microelectronics Reliability

Overview

Integrity signals

Registry

Crossref · 10.1016/j.microrel.2013.02.019

Cites

13 of 13 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Citations

Cites

Show all 13 references

Research works printed but not linked: 2

  1. van Kerschaver E, Beaucarne G. Back-contact solar cells. In: A Review, Prog. Photovolt: Res. Appl. 2006; 14: 107–123.
  2. de Jong PC et al., Single- step laminated full size PV modules with back-contacted MC-cells and conductive adhesives. In: Proc. 19th European Photovoltaic Solar Energy Conference, Paris, France; 2004.

Cited by

See all 22

Metadata

Authors
Kraemer, F., Wiese, S., Peter, E., & Seib, J.
Affiliations
  • Saarland University (DE)
  • Robert Bosch (Germany) (DE)
Venue
Microelectronics Reliability
Publisher
Elsevier BV
Published
2013-08
Volume
53
Issue
8
Pages
1095-1100
ISSN
0026-2714 (ISSN-L)
OpenAlex
W2054766869
Cited by
22
References
13
Citations by year
2025: 1 · 2023: 3 · 2022: 1 · 2021: 3 · 2020: 1 · 2019: 3 · 2017: 4 · 2016: 2 · 2015: 3 · 2013: 1
FWCI
1.20
Type
journal article
Language
en
Open access
closed
Licence
www.elsevier.com/tdm/userlicense/1.0/ (tdm)
Locations
Microelectronics Reliability (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon and Solar Cell Technologies
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electronic Packaging and Soldering Technologies
  • Physical Sciences › Energy › Renewable Energy, Sustainability and the Environment › Photovoltaic Systems and Sustainability
Keywords
thermomechanical damage, mechanical stress, solder joints, busbars, thermal cycling, module lifetime, finite element analysis

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

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How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Mechanical problems of novel back contact solar modules. https://app.cochat.ai/papers/10.1016/j.microrel.2013.02.019
The paper
Kraemer, F., Wiese, S., Peter, E., & Seib, J. (2013). Mechanical problems of novel back contact solar modules. Microelectronics Reliability. https://doi.org/10.1016/j.microrel.2013.02.019

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.