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A fully digital feedback control of gate driver for current balancing of parallel connected power devices
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“The dynamic current peak detection-based active delay compensation method is presented in [46].The peak current of the parallel-connected devices is detected, and active gate delay compensation control is demonstrated for two IGBT devices using fully digital feedback control in FPGA.”
From Paralleling of IGBT Power Semiconductor Devices and Reliability Issues (2023) · cites this paper as [46]
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Research works printed but not linked: 8
- Perez-Delgado, 2016, Current sharing control strategy for IGBTs connected in parallel, Journal of Power Electronics, 16, 769, 10.6113/JPE.2016.16.2.769 · DOI · Paper page
- Pakkinen, 2008, Simulation of the non-idealities in current sharing in parallel connected IGBT subsystem, Proc. IEEE APEC, 211
- Luo, 2016, Modern IGBT gate driving methods for enhancing reliability of high-power converters — an overview, Microelectron. Reliab., 58, 141, 10.1016/j.microrel.2015.12.022 · DOI
- Lobsiger, 2015, Closed-loop di/dt and dv/dt of IGBT gate driver, IEEE Trans. Power Ele., 30, 3402, 10.1109/TPEL.2014.2332811 · DOI
- Idir, 2006, Active gate voltage control of turn-on di/dt and turn-off dv/dt in insulated gate transistors, IEEE Trans. Power Electron., 21, 849, 10.1109/TPEL.2007.876895 · DOI
- Palmer, 2004, Active voltage control of IGBTs for high power applications, IEEE Trans. Power Electron., 19, 894, 10.1109/TPEL.2004.830078 · DOI
- Lobsiger, 2011, Decentralized active gate control for current balancing of parallel connected IGBT modules, Proc. EPE (European Conf.)
- Bortis, 2008, Active gate control for current balancing of parallel connected IGBT modules solid-state modulators, IEEE Trans. Plasma Science, 36, 2632, 10.1109/TPS.2008.2003971 · DOI · Paper page
Cited by
Paralleling of IGBT Power Semiconductor Devices and Reliability Issues
Tripathi, R. N., & Omura, I. (2023) · Electronics · doi:10.3390/electronics12183826 · Cited by 14
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Metadata
- Authors
- Tripathi, R. N., Tsukuda, M., & Omura, I.
- ORCID
- Tripathi, R.N.
- Venue
- Microelectronics Reliability
- Publisher
- Elsevier BV
- Published
- 2018-09
- Volume
- 88-90
- Pages
- 505-509
- ISSN
- 0026-2714
- Cited by
- 4
- References
- 0
- Language
- en
- Funders
- New Energy and Industrial Technology Development Organization (P10022)
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
