Cited by 102Radiation Effects in ElectronicsDistributed systems and fault toleranceParallel Computing and Optimization Techniques

Soft errors in DNN accelerators: A comprehensive review

Ibrahim, Younis, Wang, Haibin, Liu, Junyang, Wei, Jinghe, Chen, Li, Rech, Paolo, Adam, Khalid, Guo, Gang·2020·Microelectronics Reliability

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Crossref · 10.1016/j.microrel.2020.113969

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References 139 · Cited by 102

Authors
Ibrahim, Y., Wang, H., Liu, J., Wei, J., Chen, L., Rech, P., Adam, K., & Guo, G.
Affiliations
  • Hohai University (CN)
  • China Electronics Technology Group Corporation (CN)
  • University of Saskatchewan (CA)
  • Universidade Federal do Rio Grande do Sul (BR)
  • Universiti Malaysia Pahang Al-Sultan Abdullah (MY)
  • China Institute of Atomic Energy (CN)
Corresponding author
Wang, Haibin
Venue
Microelectronics Reliability
Publisher
Elsevier BV
Published
2020-12
Volume
115
Pages
113969
ISSN
0026-2714 (ISSN-L)
OpenAlex
W3096295711
Cited by
102
References
139
Citations by year
2026: 21 · 2025: 15 · 2024: 19 · 2023: 23 · 2022: 16 · 2021: 7 · 2020: 1
FWCI
3.96
Type
journal article
Language
en
Open access
closed
Locations
  • Microelectronics Reliability (publishedVersion)
  • Institutional Research Information System (Università degli Studi di Trento) (submittedVersion)
Funders
  • Fundamental Research Funds for the Central Universities (B200202216)
  • China Institute of Atomic Energy (KFZC2020010401)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Radiation Effects in Electronics
  • Physical Sciences › Computer Science › Computer Networks and Communications › Distributed systems and fault tolerance
  • Physical Sciences › Computer Science › Hardware and Architecture › Parallel Computing and Optimization Techniques
Keywords
soft errors, deep neural network accelerators, fault tolerance, transient faults, accelerator reliability, fault propagation, hardware faults, safety-critical systems

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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