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Cited by 279

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The Peak Pairs algorithm for strain mapping from HRTEM images

Galindo, Pedro L., Kret, Sławomir, Sanchez, Ana M., Laval, Jean-Yves, Yáñez, Andrés, Pizarro, Joaquín, Guerrero, Elisa, Ben, Teresa, Molina, Sergio I.·2007·Ultramicroscopy

Abstract

Strain mapping is defined as a numerical image-processing technique that measures the local shifts of image details around a crystal defect with respect to the ideal, defect-free, positions in the bulk. Algorithms to map elastic strains from high-resolution transmission electron microscopy (HRTEM) images may be classified into two categories: those based on the detection of peaks of intensity in real space and the Geometric Phase approach, calculated in Fourier space. In this paper, we discuss both categories and propose an alternative real space algorithm (Peak Pairs) based on the detection of pairs of intensity maxima in an affine transformed space dependent on the reference area. In spite of the fact that it is a real space approach, the Peak Pairs algorithm exhibits good behaviour at heavily distorted defect cores, e.g. interfaces and dislocations. Quantitative results are reported from experiments to determine local strain in different types of semiconductor heterostructures.

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Metadata

Authors
Galindo, P. L., Kret, S., Sanchez, A. M., Laval, J.-Y., Yáñez, A., Pizarro, J., Guerrero, E., Ben, T., & Molina, S. I.
Venue
Ultramicroscopy
Publisher
Elsevier BV
Published
2007-11
Volume
107
Issue
12
Pages
1186-1193
ISSN
0304-3991 (ISSN-L)
OpenAlex
W2017626098
Cited by
279
References
10
FWCI
6.46
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: The Peak Pairs algorithm for strain mapping from HRTEM images. https://app.cochat.ai/papers/10.1016/j.ultramic.2007.01.019
The paper
Galindo, P. L., Kret, S., Sanchez, A. M., Laval, J.-Y., Yáñez, A., Pizarro, J., Guerrero, E., Ben, T., & Molina, S. I. (2007). The Peak Pairs algorithm for strain mapping from HRTEM images. Ultramicroscopy. https://doi.org/10.1016/j.ultramic.2007.01.019

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