The DOI matches its Crossref record; 15 of the 15 references it cites were found in a registry or an index.
Structural and XPS characterization of ALD Al2O3 coated porous silicon
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Metal‐Assisted Chemical Etching of Silicon: A Review: In memory of Prof. Ulrich Gösele
Huang, Z., Geyer, N., Werner, P., de Boor, J., & Gösele, U. (2011) · Advanced Materials · doi:10.1002/adma.201001784 · Cited by 1,909
Low-Temperature Al2O3 Atomic Layer Deposition
Groner, M. D., Fabreguette, F. H., Elam, J. W., & George, S. M. (2004) · Chemistry of Materials · doi:10.1021/cm0304546 · Cited by 1,403
Silicon Nanowire Radial p−n Junction Solar Cells
Garnett, E. C., & Yang, P. (2008) · Journal of the American Chemical Society · doi:10.1021/ja8032907 · Cited by 907
Auger and photoelectron line energy relationships in aluminum–oxygen and silicon–oxygen compounds
Wagner, C. D., Passoja, D. E., Hillery, H. F., et al. (1982) · Journal of Vacuum Science and Technology · doi:10.1116/1.571870 · Cited by 851
Status and prospects of Al2O3-based surface passivation schemes for silicon solar cells
Dingemans, G., & Kessels, W. M. M. (2012) · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · doi:10.1116/1.4728205 · Cited by 818
Moretti, G. (1998) · Journal of Electron Spectroscopy and Related Phenomena · doi:10.1016/s0368-2048(98)00249-7 · Cited by 364
Review of porous silicon preparation and its application for lithium-ion battery anodes
Ge, M., Fang, X., Rong, J., & Zhou, C. (2013) · Nanotechnology · doi:10.1088/0957-4484/24/42/422001 · Cited by 308
Large-Scale Fabrication, 3D Tomography, and Lithium-Ion Battery Application of Porous Silicon
Ge, M., Lu, Y., Ercius, P., Rong, J., Fang, X., Mecklenburg, M., & Zhou, C. (2014) · Nano Letters · doi:10.1021/nl403923s · Cited by 248
Porous silicon biosensor: Current status
Dhanekar, S., & Jain, S. (2013) · Biosensors and Bioelectronics · doi:10.1016/j.bios.2012.09.045 · Cited by 202
Measurement of bandgap energies in low-k organosilicates
Nichols, M. T., Li, W., Pei, D., Antonelli, G. A., Lin, Q., Banna, S., Nishi, Y., & Shohet, J. L. (2014) · Journal of Applied Physics · doi:10.1063/1.4867644 · Cited by 133
Cited by
Analog Synaptic Behavior of a Silicon Nitride Memristor
Kim, S., Kim, H., Hwang, S., Kim, M.-H., Chang, Y.-F., & Park, B.-G. (2017) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.7b11191 · Cited by 252
Improving linearity by introducing Al in HfO 2 as a memristor synapse device
Chandrasekaran, S., Simanjuntak, F. M., Saminathan, R., Panda, D., & Tseng, T.-Y. (2019) · Nanotechnology · doi:10.1088/1361-6528/ab3480 · Cited by 131
Kong, F., Zhang, Y., Wang, H., Tang, J., Li, Y., & Wang, S. (2020) · Chemosphere · doi:10.1016/j.chemosphere.2020.127224 · Cited by 76
Properties of Al2O3 Thin Films Grown by PE-ALD at Low Temperature Using H2O and O2 Plasma Oxidants
Castillo-Saenz, J., Nedev, N., Valdez-Salas, B., Curiel-Alvarez, M., Mendivil-Palma, M. I., Hernandez-Como, N., Martinez-Puente, M., Mateos, D., Perez-Landeros, O., & Martinez-Guerra, E. (2021) · Coatings · doi:10.3390/coatings11101266 · Cited by 36
Fabrication process and failure analysis for robust quantum dots in silicon
Dodson, J. P., Holman, N., Thorgrimsson, B., Neyens, S. F., MacQuarrie, E. R., McJunkin, T., Foote, R. H., Edge, L. F., Coppersmith, S. N., & Eriksson, M. A. (2020) · Nanotechnology · doi:10.1088/1361-6528/abb559 · Cited by 30
Metadata
- Authors
- Iatsunskyi, I., Kempiński, M., Jancelewicz, M., Załęski, K., Jurga, S., & Smyntyna, V.
- Venue
- Vacuum
- Publisher
- Elsevier BV
- Published
- 2015-03
- Volume
- 113
- Pages
- 52-58
- ISSN
- 0042-207X (ISSN-L)
- OpenAlex
- W2010300694
- Cited by
- 347
- References
- 15
- FWCI
- 5.96
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Structural and XPS characterization of ALD Al2O3 coated porous silicon. https://app.cochat.ai/papers/10.1016/j.vacuum.2014.12.015
- The paper
- Iatsunskyi, I., Kempiński, M., Jancelewicz, M., Załęski, K., Jurga, S., & Smyntyna, V. (2015). Structural and XPS characterization of ALD Al2O3 coated porous silicon. Vacuum. https://doi.org/10.1016/j.vacuum.2014.12.015
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
