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Cited by 472Electron and X-Ray Spectroscopy TechniquesIon-surface interactions and analysisX-ray Spectroscopy and Fluorescence Analysis

The DOI matches its Crossref record; 22 of the 22 references it cites were found in a registry or an index.

XPS investigation of preferential sputtering of S from MoS2 and determination of MoSx stoichiometry from Mo and S peak positions

Baker, M.A, Gilmore, R, Lenardi, C, Gissler, W·1999·Applied Surface Science

Overview

Integrity signals

Registry

Crossref · 10.1016/s0169-4332(99)00253-6

Cites

22 of 22 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Citations

Cites

Show all 22 references

Research works printed but not linked: 2

  1. Hofmann, 1982, J. Trace Microprobe Tech., 1, 213
  2. Baker, 1997, Surface and Interface Analysis, 25, 629, 10.1002/(SICI)1096-9918(199708)25:9<629::AID-SIA313>3.0.CO;2-5 · doi:10.1002/(sici)1096-9918(199708)25:9<629::aid-sia313>3.0.co;2-5

Cited by

See all 472

Metadata

Authors
Baker, M. A., Gilmore, R., Lenardi, C., & Gissler, W.
Affiliations
European Commission (BE)
Corresponding author
Baker, M.A
Venue
Applied Surface Science
Publisher
Elsevier BV
Published
1999-08
Volume
150
Issue
1-4
Pages
255-262
ISSN
0169-4332 (ISSN-L)
OpenAlex
W2094789248
Cited by
472
References
22
Citations by year
2026: 28 · 2025: 42 · 2024: 40 · 2023: 37 · 2022: 41 · 2021: 35 · 2020: 31 · 2019: 40 · 2018: 35 · 2017: 32 · 2016: 32 · 2015: 21 · 2014: 14 · 2013: 7 · 2012: 6
FWCI
0.97
Type
journal article
Language
en
Open access
closed
Licence
www.elsevier.com/tdm/userlicense/1.0/ (tdm)
Locations
  • Applied Surface Science (publishedVersion)
  • Surrey Research Insight Open Access (The University of Surrey) (submittedVersion)
Topics
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Electron and X-Ray Spectroscopy Techniques
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Ion-surface interactions and analysis
  • Physical Sciences › Physics and Astronomy › Radiation › X-ray Spectroscopy and Fluorescence Analysis
Keywords
preferential sputtering, MoS2, molybdenum sulfide, ion bombardment, hard coatings, low-friction coatings, surface composition analysis

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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How to cite

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This page
CoChat. (2026). Citation check: XPS investigation of preferential sputtering of S from MoS2 and determination of MoSx stoichiometry from Mo and S peak positions. https://app.cochat.ai/papers/10.1016/s0169-4332(99)00253-6
The paper
Baker, M. A., Gilmore, R., Lenardi, C., & Gissler, W. (1999). XPS investigation of preferential sputtering of S from MoS2 and determination of MoSx stoichiometry from Mo and S peak positions. Applied Surface Science. https://doi.org/10.1016/s0169-4332(99)00253-6

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.