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Cited by 140Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques

The DOI matches its Crossref record; 73 of the 73 references it cites were found in a registry or an index.

Structure determination through Z-contrast microscopy

Pennycook, S.J.·2002·Advances in Imaging and Electron Physics

Overview

Integrity signals

Registry

Crossref · 10.1016/s1076-5670(02)80063-5

Cites

73 of 73 references verified0 citation errors · 0 not checkable

Statistics

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Verification

Claims the paper makes

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Claims other papers make about this one

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Citations

Cites

Show all 73 references

Research works printed but not linked: 1

  1. Rose, 1976, Image formation by inelastically scattered electrons in electron microscopy, Optik, 45, 187

Cited by

See all 140

Metadata

Authors
Pennycook, S. J.
Affiliations
Oak Ridge National Laboratory (US)
Corresponding author
Pennycook, S.J.
Venue
Advances in Imaging and Electron Physics
Publisher
Elsevier
Published
2002
Pages
173-206
ISSN
1076-5670 (ISSN-L)
OpenAlex
W1607277606
Cited by
140
References
73
Citations by year
2026: 2 · 2024: 3 · 2023: 2 · 2022: 8 · 2021: 9 · 2020: 6 · 2019: 10 · 2018: 5 · 2017: 15 · 2016: 14 · 2015: 12 · 2014: 11 · 2013: 6 · 2012: 3
FWCI
9.65
Type
book chapter
Language
en
Open access
closed
Locations
Advances in imaging and electron physics (publishedVersion)
Topics
  • Life Sciences › Biochemistry, Genetics and Molecular Biology › Structural Biology › Advanced Electron Microscopy Techniques and Applications
  • Physical Sciences › Materials Science › Surfaces, Coatings and Films › Electron and X-Ray Spectroscopy Techniques
  • Physical Sciences › Materials Science › General Materials Science › Advanced Materials Characterization Techniques
Keywords
Z-contrast imaging, electron energy loss spectroscopy, scanning transmission electron microscopy, structure determination, phase problem, impurity segregation, vacancy segregation, electronic structure, aberration correction, catalysis, structural materials, nanostructured materials

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

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This page
CoChat. (2026). Citation check: Structure determination through Z-contrast microscopy. https://app.cochat.ai/papers/10.1016/s1076-5670(02)80063-5
The paper
Pennycook, S. J. (2002). Structure determination through Z-contrast microscopy. Advances in Imaging and Electron Physics. https://doi.org/10.1016/s1076-5670(02)80063-5

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.