Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 707

The DOI matches its Crossref record.

Nanowire-based one-dimensional electronics

Open access
Thelander, C., Agarwal, P., Brongersma, S., Eymery, J., Feiner, L.F., Forchel, A., Scheffler, M., Riess, W., Ohlsson, B.J., Gösele, U., Samuelson, L.·2006·Materials Today

Abstract

During the last half century, a dramatic downscaling of electronics has taken place, a miniaturization that the industry expects to continue for at least a decade. We present efforts to use the self-assembly of one-dimensional semiconductor nanowires1 in order to bring new, high-performance nanowire devices as an add-on to mainstream Si technology. The nanowire approach offers a coaxial gate-dielectric-channel geometry that is ideal for further downscaling and electrostatic control, as well as heterostructure-based devices on Si wafers.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1016/s1369-7021(06)71651-0

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 707

Metadata

Authors
Thelander, C., Agarwal, P., Brongersma, S., Eymery, J., Feiner, L. F., Forchel, A., Scheffler, M., Riess, W., Ohlsson, B. J., Gösele, U., & Samuelson, L.
Venue
Materials Today
Publisher
Elsevier BV
Published
2006-10
Volume
9
Issue
10
Pages
28-35
ISSN
1369-7021 (ISSN-L)
OpenAlex
W2146439374
Cited by
707
References
0
FWCI
39.00
Type
journal article
Language
en
Open access
hybrid

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Nanowire-based one-dimensional electronics. https://app.cochat.ai/papers/10.1016/s1369-7021(06)71651-0
The paper
Thelander, C., Agarwal, P., Brongersma, S., Eymery, J., Feiner, L. F., Forchel, A., Scheffler, M., Riess, W., Ohlsson, B. J., Gösele, U., & Samuelson, L. (2006). Nanowire-based one-dimensional electronics. Materials Today. https://doi.org/10.1016/s1369-7021(06)71651-0

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.