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Cited by 271

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The Critical Period of Weed Control in Soybean [Glycine max(L.) Merr.]

Van Acker, Rene C., Swanton, Clarence J., Weise, Stephan F.·1993·Weed Science

Abstract

Field studies were conducted at three locations over 2 yr in southern Ontario to determine the critical period of weed control in soybean. This period generally consisted of two discrete periods, a critical weed-free period and a critical time of weed removal. The critical weed-free period was relatively short in duration and consistent across locations and years. A period of weed control lasting up to the fourth node growth stage (V4), approximately 30 days after emergence (DAE), was adequate to prevent a yield loss of more than 2.5%. The critical time of weed removal was variable across locations and years and ranged, for example, from the second node growth stage (V2) to the beginning pod growth stage (R3), approximately 9 to 38 DAE, at a 2.5% yield loss level. A phenologically based period of most rapid yield loss due to weed interference occurred from beginning bloom stage (R1) to beginning seed stage (R5). The short and consistent critical weed-free period indicates the duration of residual herbicide control necessary in soybean and supports use of nonresidual, postemergence herbicides and mechanical weed control.

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Metadata

Authors
Van Acker, R. C., Swanton, C. J., & Weise, S. F.
Venue
Weed Science
Published
1993-06
Volume
41
Issue
2
Pages
194-200
ISSN
  • 0043-1745 (ISSN-L)
  • 1550-2759
OpenAlex
W2142853473
Cited by
271
References
0
FWCI
4.84
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: The Critical Period of Weed Control in Soybean [Glycine max(L.) Merr.]. https://app.cochat.ai/papers/10.1017/s0043174500076050
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Van Acker, R. C., Swanton, C. J., & Weise, S. F. (1993). The Critical Period of Weed Control in Soybean [Glycine max(L.) Merr.]. Weed Science. https://doi.org/10.1017/s0043174500076050

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.