The serial test for sampling numbers and other tests for randomness
Abstract
In the serial test for sampling numbers ( 3, 4 ) an expression is used. It is in the form of a sum of squares and has previously been supposed to have asymptotically a χ 2 (γ-variate) distribution. By evaluating it is shown that this supposition cannot be correct, since is not equal to the number of degrees of freedom. The evaluation is based on some results which can be used for testing a wide class of properties of random sequences. The definition of is generalized to deal with subsequences of length ν (instead of length 2) and the generalized , or is then decomposed into a linear form of simple variates defined in terms of discrete Fourier transforms. When the number, t, of digits in the sample space is prime these simple variates are shown to have asymptotically independent χ 2 distributions with one degree of freedom each. The coefficients of the linear form are not 1 but they become 1 when the first and second differences with respect to ν are taken. Thus and have asymptotically χ 2 distributions. The work is closely related to that of Bartlett (1) and Vajda (6).
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The convergence of the serial test statistic ∇ψ_m^2 to the chi-square distribution was proven by Good (1953).
“The convergence of ∇ψ m 2 to the Χ 2 -distribution was proven by Good (1953).”
From A statistical test suite for random and pseudorandom number generators for cryptographic applications (2010) · cites this paper as Good (1953)
The convergence of ∇ψ_m^2 to the X2-distribution was proven by Good (1953).
“The convergence of ∇ψ m 2 to the Χ 2 -distribution was proven by Good (1953).”
From A statistical test suite for random and pseudorandom number generators for cryptographic applications (2010) · cites this paper as Good (1953)
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Bassham, L. E., Rukhin, A. L., Soto, J., Nechvatal, J. R., Smid, M. E., Barker, E. B., Leigh, S. D., Levenson, M., Vangel, M., Banks, D. L., et al. (2010) · NIST Special Publication 800-22 Revision 1a · doi:10.6028/nist.sp.800-22r1a · Cited by 3,617 · see citing works
Sparse serial tests of uniformity for random number generators
L'Ecuyer, P., Simard, R., & Wegenkittl, S. (2002) · SIAM Journal on Scientific Computing · doi:10.1137/s1064827598349033 · Cited by 50 · see citing works
- Authors
- Good, I. J.
- Corresponding author
- Good, I. J.
- Venue
- Mathematical Proceedings of the Cambridge Philosophical Society
- Publisher
- Cambridge University Press (CUP)
- Published
- 1953-04
- Volume
- 49
- Issue
- 2
- Pages
- 276-284
- ISSN
- 0305-0041 (ISSN-L)
- 1469-8064
- OpenAlex
- W2025467229
- Cited by
- 115
- References
- 0
- Citations by year
- 2025: 2 · 2024: 2 · 2023: 5 · 2021: 2 · 2020: 2 · 2018: 2 · 2017: 2 · 2016: 2 · 2015: 2 · 2014: 3 · 2013: 2 · 2012: 1
- FWCI
- 3.88
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Mathematical Proceedings of the Cambridge Philosophical Society (publishedVersion)
- Topics
- Physical Sciences › Mathematics › Statistics and Probability › Probability and Statistical Research
- Physical Sciences › Mathematics › Algebra and Number Theory › Analytic Number Theory Research
- Physical Sciences › Mathematics › Numerical Analysis › Mathematical Approximation and Integration
- Keywords
- randomness testing, random number generators, chi-square distribution, degrees of freedom, discrete Fourier transform, linear combinations of random variables, asymptotic independence, prime modulus, random sequences
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