The DOI matches its Crossref record; 91 of the 91 references it cites were found in a registry or an index.
AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging
Abstract
Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. AFM-IR works by using the tip of an AFM probe to locally detect thermal expansion in a sample resulting from absorption of infrared radiation. AFM-IR thus can provide the spatial resolution of AFM in combination with the chemical analysis and compositional imaging capabilities of infrared spectroscopy. This article briefly reviews the development and underlying technology of AFM-IR, including recent advances, and then surveys a wide range of applications and investigations using AFM-IR. AFM-IR applications that will be discussed include those in polymers, life sciences, photonics, solar cells, semiconductors, pharmaceuticals, and cultural heritage. In the Supporting Information , the authors provide a theoretical section that reviews the physics underlying the AFM-IR measurement and detection mechanisms.
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Metadata
- Authors
- Dazzi, A., & Prater, C. B.
- Venue
- Chemical Reviews
- Publisher
- American Chemical Society (ACS)
- Published
- 2016-12-13
- Volume
- 117
- Issue
- 7
- Pages
- 5146-5173
- ISSN
- 0009-2665 (ISSN-L)
- 1520-6890
- OpenAlex
- W2561531429
- Cited by
- 1,082
- References
- 91
- FWCI
- 2.82
- Type
- journal article
- Language
- en
- Open access
- closed
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