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Joining of Silver Nanomaterials at Low Temperatures: Processes, Properties, and Applications
Abstract
A review is provided, which first considers low-temperature diffusion bonding with silver nanomaterials as filler materials via thermal sintering for microelectronic applications, and then other recent innovations in low-temperature joining are discussed. The theoretical background and transition of applications from micro to nanoparticle (NP) pastes based on joining using silver filler materials and nanojoining mechanisms are elucidated. The mechanical and electrical properties of sintered silver nanomaterial joints at low temperatures are discussed in terms of the key influencing factors, such as porosity and coverage of substrates, parameters for the sintering processes, and the size and shape of nanomaterials. Further, the use of sintered silver nanomaterials for printable electronics and as robust surface-enhanced Raman spectroscopy substrates by exploiting their optical properties is also considered. Other low-temperature nanojoining strategies such as optical welding of silver nanowires (NWs) through a plasmonic heating effect by visible light irradiation, ultrafast laser nanojoining, and ion-activated joining of silver NPs using ionic solvents are also summarized. In addition, pressure-driven joining of silver NWs with large plastic deformation and self-joining of gold or silver NWs via oriented attachment of clean and activated surfaces are summarized. Finally, at the end of this review, the future outlook for joining applications with silver nanomaterials is explored.
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Cites
A new finite element model for welding heat sources
Goldak, J., Chakravarti, A., & Bibby, M. (1984) · Metallurgical Transactions B · doi:10.1007/bf02667333 · Cited by 3,374
Vitos, L., Ruban, A. V., Skriver, H. L., & Kollár, J. (1998) · Surface Science · doi:10.1016/s0039-6028(98)00363-x · Cited by 2,768
German, R. M. (1996) · CERN Document Server (European Organization for Nuclear Research) · Cited by 2,502
Recent advances in friction-stir welding – Process, weldment structure and properties
NANDAN, R., DEBROY, T., & BHADESHIA, H. (2008) · Progress in Materials Science · doi:10.1016/j.pmatsci.2008.05.001 · Cited by 2,098
Scalable Coating and Properties of Transparent, Flexible, Silver Nanowire Electrodes
Hu, L., Kim, H. S., Lee, J.-Y., Peumans, P., & Cui, Y. (2010) · ACS Nano · doi:10.1021/nn1005232 · Cited by 2,075
Shape‐Controlled Synthesis of Metal Nanostructures: The Case of Silver
Wiley, B., Sun, Y., Mayers, B., & Xia, Y. (2005) · Chemistry – A European Journal · doi:10.1002/chem.200400927 · Cited by 1,643
Horiuchi, S., & Tokura, Y. (2008) · Nature Materials · doi:10.1038/nmat2137 · Cited by 1,189
Sintering Crystalline Solids. I. Intermediate and Final State Diffusion Models
COBLE, R. L. (1961) · Journal of Applied Physics · doi:10.1063/1.1736107 · Cited by 1,152
Self-limited plasmonic welding of silver nanowire junctions
Garnett, E. C., Cai, W., Cha, J. J., Mahmood, F., Connor, S. T., Greyson Christoforo, M., Cui, Y., McGehee, M. D., & Brongersma, M. L. (2012) · Nature Materials · doi:10.1038/nmat3238 · Cited by 1,147
Ko, S. H., Pan, H., Grigoropoulos, C. P., Luscombe, C. K., Fréchet, J. M. J., & Poulikakos, D. (2007) · Nanotechnology · doi:10.1088/0957-4484/18/34/345202 · Cited by 770
Metadata
- Authors
- Peng, P., Hu, A., Gerlich, A. P., Zou, G., Liu, L., & Zhou, Y. N.
- Venue
- ACS Applied Materials & Interfaces
- Publisher
- American Chemical Society (ACS)
- Published
- 2015-06-04
- Volume
- 7
- Issue
- 23
- Pages
- 12597-12618
- ISSN
- 1944-8244 (ISSN-L)
- 1944-8252
- OpenAlex
- W425528235
- Cited by
- 364
- References
- 94
- FWCI
- 16.68
- Type
- journal article
- Language
- en
- Open access
- closed
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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