Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 947

The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.

Large In-Plane and Vertical Piezoelectricity in Janus Transition Metal Dichalchogenides

Dong, Liang, Lou, Jun, Shenoy, Vivek B.·2017·ACS Nano

Abstract

Piezoelectricity in 2D van der Waals materials has received considerable interest because of potential applications in nanoscale energy harvesting, sensors, and actuators. However, in all the systems studied to date, strain and electric polarization are confined to the basal plane, limiting the operation of piezoelectric devices. In this paper, based on ab initio calculations, we report a 2D materials system, namely, the recently synthesized Janus MXY (M = Mo or W, X/Y = S, Se, or Te) monolayer and multilayer structures, with large out-of-plane piezoelectric polarization. For MXY monolayers, both strong in-plane and much weaker out-of-plane piezoelectric polarizations can be induced by a uniaxial strain in the basal plane. For multilayer MXY, we obtain a very strong out-of-plane piezoelectric polarization when strained transverse to the basal plane, regardless of the stacking sequence. The out-of-plane piezoelectric coefficient d 33 is found to be strongest in multilayer MoSTe (5.7–13.5 pm/V depending on the stacking sequence), which is larger than that of the commonly used 3D piezoelectric material AlN ( d 33 = 5.6 pm/V); d 33 in other multilayer MXY structures are a bit smaller, but still comparable. Our study reveals the potential for utilizing piezoelectric 2D materials and their van der Waals multilayers in device applications.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1021/acsnano.7b03313

Cites

5 of 5 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Cited by

See all 947

Metadata

Authors
Dong, L., Lou, J., & Shenoy, V. B.
Venue
ACS Nano
Published
2017-07-17
Volume
11
Issue
8
Pages
8242-8248
ISSN
  • 1936-0851 (ISSN-L)
  • 1936-086X
OpenAlex
W2734733231
Cited by
947
References
5
FWCI
21.12
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.