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Quantized adhesion detected with the atomic force microscope
Abstract
The atomic force microscope (AFM) is rapidly becoming a powerful tool for investigating surface chemistry and adhesion. Current efforts with this new instrument are guided by the pioneering research of Israelachvili and his colleagues, whose work with the surface force apparatus has laid the foundation for investigating interactions near and between surfaces. The AFM is capable of measuring forces of less than 10^(-11) N with high spatial resolution, thus making possible the study of very weak interactions and local surface chemistry. Here we report the first (to our knowledge) observation of discrete adhesive interactions with measured forces of 1 x 10^(-11) N. Two mechanisms for this effect are proposed: individual hydrogen bonds between the tip and surface are resolved or ordered water layers create different force minima near the surface.
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Citations
Cited by
Molecular Structure of Water at Interfaces: Wetting at the Nanometer Scale
Verdaguer, A., Sacha, G. M., Bluhm, H., & Salmeron, M. (2006) · Chemical Reviews · doi:10.1021/cr040376l · Cited by 627
Force Spectroscopy of Molecular Systems—Single Molecule Spectroscopy of Polymers and Biomolecules
Janshoff, A., Neitzert, M., Oberdörfer, Y., & Fuchs, H. (2000) · Angewandte Chemie · doi:10.1002/1521-3773(20000915)39:18<3212::aid-anie3212>3.0.co;2-x · Cited by 502
Probing Liquid/Solid Interfaces at the Molecular Level
Zaera, F. (2012) · Chemical Reviews · doi:10.1021/cr2002068 · Cited by 458
Single molecule force spectroscopy in biology using the atomic force microscope
Zlatanova, J., Lindsay, S. M., & Leuba, S. H. (2000) · Progress in Biophysics and Molecular Biology · doi:10.1016/s0079-6107(00)00014-6 · Cited by 375
Spatially resolved force spectroscopy of biological surfaces using the atomic force microscope
Heinz, W. F., & Hoh, J. H. (1999) · Trends in Biotechnology · doi:10.1016/s0167-7799(99)01304-9 · Cited by 373
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Metadata
- Authors
- Hoh, J. H., Cleveland, J. P., Prater, C. B., Revel, J. P., & Hansma, P. K.
- Venue
- Journal of the American Chemical Society
- Publisher
- American Chemical Society (ACS)
- Published
- 1992-06
- Volume
- 114
- Issue
- 12
- Pages
- 4917-4918
- ISSN
- 0002-7863 (ISSN-L)
- 1520-5126
- OpenAlex
- W1973069050
- Cited by
- 252
- References
- 0
- FWCI
- 7.13
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Quantized adhesion detected with the atomic force microscope. https://app.cochat.ai/papers/10.1021/ja00038a075
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- Hoh, J. H., Cleveland, J. P., Prater, C. B., Revel, J. P., & Hansma, P. K. (1992). Quantized adhesion detected with the atomic force microscope. Journal of the American Chemical Society. https://doi.org/10.1021/ja00038a075
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
