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Slow Surface Charge Trapping Kinetics on Irradiated TiO2
Abstract
Free and trapped charge carriers in polycrystalline TiO 2 following band gap irradiation are characterized by diffuse reflectance IR spectroscopy (DRIFTS). A spectrum-wide absorption signal proportional to λ 1.7 (λ = wavelength/μm) indicates the presence of free conduction band electrons coupled with acoustic phonons in the lattice. Free electrons appear to decay according to saturation kinetics. The fitted parameters indicate a limited number of trapping states. The concentration of these states appears to be diminished by sequential UV treatments. The free carrier decay lifetime is lengthened as the samples are dehydrated, which suggests an excited-state relaxation event during electron trapping. Photogenerated free electrons are comparable to conduction band electrons injected from surface-bound chromophores, and the lifetime of these electrons can be extended across several orders of magnitude. A broad IR absorption peak centered at 3380 cm -1 is attributed to an electronic transition from an occupied surface electron trap 0.42 eV below the conduction band.
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Citations
Cited by
Surface Science Studies of the Photoactivation of TiO 2 New Photochemical Processes
Thompson, T. L., & Yates, J. T. (2006) · Chemical Reviews · doi:10.1021/cr050172k · Cited by 2,064
A surface science perspective on TiO2 photocatalysis
Henderson, M. A. (2011) · Surface Science Reports · doi:10.1016/j.surfrep.2011.01.001 · Cited by 2,038
Li, K., Gao, S., Wang, Q., Xu, H., Wang, Z., Huang, B., Dai, Y., & Lu, J. (2015) · ACS Applied Materials & Interfaces · doi:10.1021/am508505n · Cited by 553
Li, F. B., Li, X. Z., Hou, M. F., Cheah, K. W., & Choy, W. C. H. (2005) · Applied Catalysis A: General · doi:10.1016/j.apcata.2005.02.025 · Cited by 443
Henderson, M. A., Epling, W. S., Peden, C. H. F., & Perkins, C. L. (2003) · The Journal of Physical Chemistry B · doi:10.1021/jp0262113 · Cited by 443
Metadata
- Authors
- Szczepankiewicz, S. H., Moss, J. A., & Hoffmann, M. R.
- Venue
- The Journal of Physical Chemistry B
- Publisher
- American Chemical Society (ACS)
- Published
- 2002-02-20
- Volume
- 106
- Issue
- 11
- Pages
- 2922-2927
- ISSN
- 1520-5207 (ISSN-L)
- 1520-6106
- OpenAlex
- W2040694987
- Cited by
- 195
- References
- 0
- FWCI
- 7.12
- Type
- journal article
- Language
- en
- Open access
- closed
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- Szczepankiewicz, S. H., Moss, J. A., & Hoffmann, M. R. (2002). Slow Surface Charge Trapping Kinetics on Irradiated TiO2. The Journal of Physical Chemistry B. https://doi.org/10.1021/jp004244h
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