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Porosity and Mechanical Properties of Mesoporous Thin Films Assessed by Environmental Ellipsometric Porosimetry
Abstract
Mesoordered silica thin films with cubic structures were prepared by evaporation induced self-assembly (EISA) with two types of structuring agent (CTAB and block copolymer F127). A complete and accurate description of these films was obtained by combining 2D-SAXS analyses, variable angle spectroscopic ellipsometry, and a specially designed environmental ellipsometric porosimetry (EEP) experiment. The EEP analysis is rapid and cheap and operates at ambient pressure and temperature. This latter experiment was performed with water and produced a set of water adsorption-desorption isotherms. A modified Kelvin equation, coupled with a modelisation of pores contraction, enabled the determination of the structural parameters of films porous networks: ellipsoidal pore diameters, porous volume, and surface area. Young moduli of films in the direction perpendicular to the substrates were calculated from these parameters.
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Citations
Cited by
Tan, J. C., & Cheetham, A. K. (2011) · Chemical Society Reviews · doi:10.1039/c0cs00163e · Cited by 762
Mesoporous materials and electrochemistry
Walcarius, A. (2013) · Chemical Society Reviews · doi:10.1039/c2cs35322a · Cited by 623
Metadata
- Authors
- Boissiere, C., Grosso, D., Lepoutre, S., Nicole, L., Bruneau, A. B., & Sanchez, C.
- Venue
- Langmuir
- Publisher
- American Chemical Society (ACS)
- Published
- 2005-11-23
- Volume
- 21
- Issue
- 26
- Pages
- 12362-12371
- ISSN
- 0743-7463 (ISSN-L)
- 1520-5827
- OpenAlex
- W2041069621
- Cited by
- 446
- References
- 0
- FWCI
- 8.67
- Type
- journal article
- Language
- en
- Open access
- closed
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- Boissiere, C., Grosso, D., Lepoutre, S., Nicole, L., Bruneau, A. B., & Sanchez, C. (2005). Porosity and Mechanical Properties of Mesoporous Thin Films Assessed by Environmental Ellipsometric Porosimetry. Langmuir. https://doi.org/10.1021/la050981z
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