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Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope

Zhao, Min-Hua, Wang, Zhong-Lin, Mao, Scott X.·2004·Nano Letters

Abstract

Piezoresponse force microscopy (PFM) is used to measure the effective piezoelectric coefficient ( d 33 ) of an individual (0001) surface dominated zinc oxide nanobelt lying on a conductive surface. Based on references of bulk (0001) ZnO and x -cut quartz, the effective piezoelectric coefficient d 33 of ZnO nanobelt is found to be frequency dependent and varies from 14.3 pm/V to 26.7 pm/V, which is much larger than that of the bulk (0001) ZnO of 9.93 pm/V. The results support the application of ZnO nanobelts as nanosensors and nanoactuators.

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Metadata

Authors
Zhao, M.-H., Wang, Z.-L., & Mao, S. X.
Venue
Nano Letters
Published
2004-02-28
Volume
4
Issue
4
Pages
587-590
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W2023433979
Cited by
742
References
0
FWCI
12.91
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope. https://app.cochat.ai/papers/10.1021/nl035198a
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Zhao, M.-H., Wang, Z.-L., & Mao, S. X. (2004). Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope. Nano Letters. https://doi.org/10.1021/nl035198a

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