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Cited by 297

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Elastic Property of Vertically Aligned Nanowires

Song, Jinhui, Wang, Xudong, Riedo, Elisa, Wang, Zhong L.·2005·Nano Letters

Abstract

An atomic force microscopy (AFM) based technique is demonstrated for measuring the elastic modulus of individual nanowires/nanotubes aligned on a solid substrate without destructing or manipulating the sample. By simultaneously acquiring the topography and lateral force image of the aligned nanowires in the AFM contacting mode, the elastic modulus of the individual nanowires in the image has been derived. The measurement is based on quantifying the lateral force required to induce the maximal deflection of the nanowire where the AFM tip was scanning over the surface in contact mode. For the [0001] ZnO nanowires/nanorods grown on a sapphire surface with an average diameter of 45 nm, the elastic modulus is measured to be 29 +/- 8 GPa.

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Metadata

Authors
Song, J., Wang, X., Riedo, E., & Wang, Z. L.
Venue
Nano Letters
Published
2005-09-01
Volume
5
Issue
10
Pages
1954-1958
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W2138257097
Cited by
297
References
0
FWCI
17.01
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Elastic Property of Vertically Aligned Nanowires. https://app.cochat.ai/papers/10.1021/nl051334v
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Song, J., Wang, X., Riedo, E., & Wang, Z. L. (2005). Elastic Property of Vertically Aligned Nanowires. Nano Letters. https://doi.org/10.1021/nl051334v

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