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Cited by 1,491

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Atomic Structure of Graphene on SiO2

Open access
Ishigami, Masa, Chen, J. H., Cullen, W. G., Fuhrer, M. S., Williams, E. D.·2007·Nano Letters

Abstract

We employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e., a graphene sheet supported by an insulating silicon dioxide substrate) for the first time. Atomic resolution scanning tunneling microscopy images reveal the presence of a strong spatially dependent perturbation, which breaks the hexagonal lattice symmetry of the graphitic lattice. Structural corrugations of the graphene sheet partially conform to the underlying silicon oxide substrate. These effects are obscured or modified on graphene devices processed with normal lithographic methods, as they are covered with a layer of photoresist residue. We enable our experiments by a novel cleaning process to produce atomically clean graphene sheets.

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Crossref · 10.1021/nl070613a

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Metadata

Authors
Ishigami, M., Chen, J. H., Cullen, W. G., Fuhrer, M. S., & Williams, E. D.
Venue
Nano Letters
Published
2007-05-11
Volume
7
Issue
6
Pages
1643-1648
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W2123070389
Cited by
1,491
References
3
FWCI
47.72
Type
journal article
Language
en
Open access
green

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.