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Orientation-Controlled Self-Assembled Nanolithography Using a Polystyrene−Polydimethylsiloxane Block Copolymer

Jung, Yeon Sik, Ross, C. A.·2007·Nano Letters

Abstract

Templated self-assembly of a cylinder-forming poly(styrene-b-dimethylsiloxane) (PS-PDMS) diblock copolymer has been investigated for nanolithography applications. The large chi-parameter of the blocks and the use of a PDMS-brush substrate surface treatment are especially advantageous for achieving long-range ordering and minimizing defect densities, and the high Si content in PDMS leaves a robust oxide etch mask after two-step reactive ion etching. By adjusting mesa width and solvent-annealing vapor pressure and time, the cylinders can be intentionally oriented parallel or perpendicular to the trench walls. Pattern transfer into thin silica is also demonstrated. This block copolymer system has excellent characteristics for self-assembled nanolithography applications.

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Metadata

Authors
Jung, Y. S., & Ross, C. A.
Venue
Nano Letters
Published
2007-06-15
Volume
7
Issue
7
Pages
2046-2050
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W1998009021
Cited by
449
References
0
FWCI
10.97
Type
journal article
Language
en
Open access
closed

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Jung, Y. S., & Ross, C. A. (2007). Orientation-Controlled Self-Assembled Nanolithography Using a Polystyrene−Polydimethylsiloxane Block Copolymer. Nano Letters. https://doi.org/10.1021/nl070924l

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