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Cited by 1,181

The DOI matches its Crossref record; 8 of the 8 references it cites were found in a registry or an index.

Graphene Thickness Determination Using Reflection and Contrast Spectroscopy

Ni, Z. H., Wang, H. M., Kasim, J., Fan, H. M., Yu, T., Wu, Y. H., Feng, Y. P., Shen, Z. X.·2007·Nano Letters

Abstract

We have clearly discriminated the single-, bilayer-, and multiple-layer graphene (<10 layers) on Si substrate with a 285 nm SiO2 capping layer by using contrast spectra, which were generated from the reflection light of a white light source. Calculations based on Fresnel's law are in excellent agreement with the experimental results (deviation 2%). The contrast image shows the reliability and efficiency of this new technique. The contrast spectrum is a fast, nondestructive, easy to be carried out, and unambiguous way to identify the numbers of layers of graphene sheet. We provide two easy-to-use methods to determine the number of graphene layers based on contrast spectra: a graphic method and an analytical method. We also show that the refractive index of graphene is different from that of graphite. The results are compared with those obtained using Raman spectroscopy.

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Metadata

Authors
Ni, Z. H., Wang, H. M., Kasim, J., Fan, H. M., Yu, T., Wu, Y. H., Feng, Y. P., & Shen, Z. X.
Venue
Nano Letters
Published
2007-07-26
Volume
7
Issue
9
Pages
2758-2763
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W2161538601
Cited by
1,181
References
8
FWCI
24.13
Type
journal article
Language
en
Open access
closed

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.