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Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy

Open access
Yoon, Duhee, Son, Young-Woo, Cheong, Hyeonsik·2011·Nano Letters

Abstract

The thermal expansion coefficient (TEC) of single-layer graphene is estimated with temperature-dependent Raman spectroscopy in the temperature range between 200 and 400 K. It is found to be strongly dependent on temperature but remains negative in the whole temperature range with a room temperature value of (-8.0 ± 0.7) × 10(-6) K(-1). The strain caused by the TEC mismatch between graphene and the substrate plays a crucial role in determining the physical properties of graphene, and hence its effect must be accounted for in the interpretation of experimental data taken at cryogenic or elevated temperatures.

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Metadata

Authors
Yoon, D., Son, Y.-W., & Cheong, H.
Venue
Nano Letters
Published
2011-07-11
Volume
11
Issue
8
Pages
3227-3231
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W2052872572
Cited by
1,076
References
6
FWCI
19.37
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy. https://app.cochat.ai/papers/10.1021/nl201488g
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Yoon, D., Son, Y.-W., & Cheong, H. (2011). Negative Thermal Expansion Coefficient of Graphene Measured by Raman Spectroscopy. Nano Letters. https://doi.org/10.1021/nl201488g

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