The DOI matches its Crossref record; 28 of the 28 references it cites were found in a registry or an index.
On the degradation mechanisms of quantum-dot light-emitting diodes
Open accessAbstract
The operating lifetime of blue quantum-dot light-emitting diodes (QLED) is currently a short slab for this emerging display technology. To pinpoint the origin of device degradation, here we apply multiple techniques to monitor the electric-field distribution and space-charge accumulation across the multilayered structure before and after lifetime tests. Evident by charge-modulated electro-absorption and capacitance-voltage characteristics, the excited electrons in blue quantum dots (QD) are prone to cross the type II junction between the QD emission layer and the electron-transporting layer (ETL) due to the offset of conduction band minimum, leading to space-charge accumulation and operating-voltage rise in the ETL. Therefore, unlike those very stable red devices, of which the lifetime is primarily limited by the slow degradation of hole-transporting layer, the poor lifetime of blue QLED originates from the fast degradation at the QD-ETL junction. Materials engineering for efficient electron injection is prerequisite for the boost of operating lifetime.
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Cited by
Colloidal quantum dot electronics
Liu, M., Yazdani, N., Yarema, M., Jansen, M., Wood, V., & Sargent, E. H. (2021) · Nature Electronics · doi:10.1038/s41928-021-00632-7 · Cited by 448
Environmentally Friendly InP-Based Quantum Dots for Efficient Wide Color Gamut Displays
Jang, E., Kim, Y., Won, Y.-H., Jang, H., & Choi, S.-M. (2020) · ACS Energy Letters · doi:10.1021/acsenergylett.9b02851 · Cited by 267
Metadata
- Authors
- Chen, S., Cao, W., Liu, T., Tsang, S.-W., Yang, Y., Yan, X., & Qian, L.
- Venue
- Nature Communications
- Published
- 2019-02-15
- Volume
- 10
- Issue
- 1
- Pages
- 765-765
- ISSN
- 2041-1723 (ISSN-L)
- OpenAlex
- W2913875262
- Cited by
- 299
- References
- 28
- FWCI
- 10.94
- Type
- journal article
- Language
- en
- Open access
- gold
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