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Cited by 429

The DOI matches its Crossref record; 39 of the 39 references it cites were found in a registry or an index.

Heteroepitaxial passivation of Cs2AgBiBr6 wafers with suppressed ionic migration for X-ray imaging

Open access
Yang, Bo, Pan, Weicheng, Wu, Haodi, Niu, Guangda, Yuan, Jun-Hui, Xue, Kan-Hao, Yin, Lixiao, Du, Xinyuan, Miao, Xiang-Shui, Yang, Xiaoquan, Xie, Qingguo, Tang, Jiang·2019·Nature Communications

Abstract

X-ray detectors are broadly utilized in medical imaging and product inspection. Halide perovskites recently demonstrate excellent performance for direct X-ray detection. However, ionic migration causes large noise and baseline drift, limiting the detection and imaging performance. Here we largely eliminate the ionic migration in cesium silver bismuth bromide (Cs 2 AgBiBr 6) polycrystalline wafers by introducing bismuth oxybromide (BiOBr) as heteroepitaxial passivation layers. Good lattice match between BiOBr and Cs 2 AgBiBr 6 enables complete defect passivation and suppressed ionic migration. The detector hence achieves outstanding balanced performance with a signal drifting one order of magnitude lower than all previous studies, low noise (1/f noise free), a high sensitivity of 250 µC Gy air−1 cm–2, and a spatial resolution of 4.9 lp mm−1. The wafer area could be easily scaled up by the isostatic-pressing method, together with the heteroepitaxial passivation, strengthens the competitiveness of Cs 2 AgBiBr 6-based X-ray detectors as next-generation X-ray imaging flat panels.

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Metadata

Authors
Yang, B., Pan, W., Wu, H., Niu, G., Yuan, J.-H., Xue, K.-H., Yin, L., Du, X., Miao, X.-S., Yang, X., Xie, Q., & Tang, J.
Venue
Nature Communications
Published
2019-04-30
Volume
10
Issue
1
Pages
1989-1989
ISSN
2041-1723 (ISSN-L)
OpenAlex
W2943521861
Cited by
429
References
39
FWCI
35.61
Type
journal article
Language
en
Open access
gold

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Yang, B., Pan, W., Wu, H., Niu, G., Yuan, J.-H., Xue, K.-H., Yin, L., Du, X., Miao, X.-S., Yang, X., Xie, Q., & Tang, J. (2019). Heteroepitaxial passivation of Cs2AgBiBr6 wafers with suppressed ionic migration for X-ray imaging. Nature Communications. https://doi.org/10.1038/s41467-019-09968-3

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