Laminated structure design accommodates thermal expansion mismatch for mechanically and thermally dual-stable thermoelectric contacts
Open accessAbstract
The quality of the barrier layer (BL) directly determines the long-term stability of thermoelectric (TE) modules. Conventional BLs struggle to simultaneously achieve thermal expansion matching with TE materials and robust diffusion-blocking capability. Here we show a bimetallic multilayer BL strategy that ensures thermal expansion matching while constructing a controllable interfacial stress field to inhibit element diffusion. Taking skutterudite (SKD) as an example, we construct a BL with alternating Nb and Cu layers, in which Nb serves as the primary diffusion barrier, while Cu tailors the effective thermal expansion behavior and regulates the stress field at the SKD/Nb interface via Nb/Cu back stress, thereby achieving mechanical stability and a strong diffusion-blocking effect. After aging at 823 K for 60 days, the SKD/Nb-Cu interface remains intact and maintains a low contact resistivity ( < 1 μΩ·cm²). Furthermore, the strategy proves effective in Bi2Te3- and GeTe-based TE systems, demonstrating its universality. This work proposes a design strategy based on laminated metals, in which thermal expansion of the barrier layer is tailored to regulate interfacial stress–diffusion coupling, enabling mechanically and thermally dual-stable thermoelectric contacts.
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
- Authors
- Zhang, X., Wu, H., Yu, K., Gong, Y., Tong, H., Zhang, Z., Du, J., Qin, X., Deng, Y., Sun, Y., Li, X., Liu, Z., Zhu, J., Guo, F., & Sui, J.
- Affiliations
- Harbin Institute of Technology (CN)
- China Institute of Atomic Energy (CN)
- Corresponding author
- Guo, Fengkai
- Sui, Jiehe
- Venue
- Nature Communications
- Published
- 2026-10-19
- ISSN
- 2041-1723 (ISSN-L)
- OpenAlex
- W7222871117
- Cited by
- 0
- References
- 0
- FWCI
- 0.00
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Licence
- Locations
- Nature Communications (publishedVersion, cc-by-nc-nd)
- Funders
- National Natural Science Foundation of China (U23A20556, 52522222, 52472197)
- Stable-Support Program of the China Institute of Atomic Energy
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Advanced Thermoelectric Materials and Devices
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Semiconductor materials and interfaces
- Keywords
- thermal expansion mismatch, mechanical stability, thermal stability, thermoelectric energy harvesting
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review