Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 688

The DOI matches its Crossref record; 17 of the 17 references it cites were found in a registry or an index.

Wafer-scale single-crystal hexagonal boron nitride monolayers on Cu (111)

Open access
Chen, Tse-An, Chuu, Chih-Piao, Tseng, Chien-Chih, Wen, Chao-Kai, Wong, H.-S. Philip, Pan, Shuangyuan, Li, Rongtan, Chao, Tzu-Ang, Chueh, Wei-Chen, Zhang, Yanfeng, Fu, Qiang, Yakobson, Boris I., Chang, Wen-Hao, Li, Lain-Jong·2020·Nature

Abstract

Ultrathin two-dimensional (2D) semiconducting layered materials offer great potential for extending Moore’s law of the number of transistors in an integrated circuit1. One key challenge with 2D semiconductors is to avoid the formation of charge scattering and trap sites from adjacent dielectrics. An insulating van der Waals layer of hexagonal boron nitride (hBN) provides an excellent interface dielectric, efficiently reducing charge scattering2,3. Recent studies have shown the growth of single-crystal hBN films on molten gold surfaces4 or bulk copper foils5. However, the use of molten gold is not favoured by industry, owing to its high cost, cross-contamination and potential issues of process control and scalability. Copper foils might be suitable for roll-to-roll processes, but are unlikely to be compatible with advanced microelectronic fabrication on wafers. Thus, a reliable way of growing single-crystal hBN films directly on wafers would contribute to the broad adoption of 2D layered materials in industry. Previous attempts to grow hBN monolayers on Cu (111) metals have failed to achieve mono-orientation, resulting in unwanted grain boundaries when the layers merge into films6,7. Growing single-crystal hBN on such high-symmetry surface planes as Cu (111)5,8 is widely believed to be impossible, even in theory. Nonetheless, here we report the successful epitaxial growth of single-crystal hBN monolayers on a Cu (111) thin film across a two-inch c-plane sapphire wafer. This surprising result is corroborated by our first-principles calculations, suggesting that the epitaxial growth is enhanced by lateral docking of hBN to Cu (111) steps, ensuring the mono-orientation of hBN monolayers. The obtained single-crystal hBN, incorporated as an interface layer between molybdenum disulfide and hafnium dioxide in a bottom-gate configuration, enhanced the electrical performance of transistors. This reliable approach to producing wafer-scale single-crystal hBN paves the way to future 2D electronics. The epitaxial growth of single-crystal hexagonal boron nitride monolayers on a copper (111) thin film across a sapphire wafer suggests a route to the broad adoption of two-dimensional layered semiconductor materials in industry.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1038/s41586-020-2009-2

Cites

17 of 17 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 17 references

Metadata

Authors
Chen, T.-A., Chuu, C.-P., Tseng, C.-C., Wen, C.-K., Wong, H.-S. P., Pan, S., Li, R., Chao, T.-A., Chueh, W.-C., Zhang, Y., Fu, Q., Yakobson, B. I., Chang, W.-H., & Li, L.-J.
Venue
Nature
Published
2020-03-04
Volume
579
Issue
7798
Pages
219-223
ISSN
  • 0028-0836 (ISSN-L)
  • 1476-4687
OpenAlex
W3009864654
Cited by
688
References
17
FWCI
36.92
Type
journal article
Language
en
Open access
green

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Wafer-scale single-crystal hexagonal boron nitride monolayers on Cu (111). https://app.cochat.ai/papers/10.1038/s41586-020-2009-2
The paper
Chen, T.-A., Chuu, C.-P., Tseng, C.-C., Wen, C.-K., Wong, H.-S. P., Pan, S., Li, R., Chao, T.-A., Chueh, W.-C., Zhang, Y., Fu, Q., Yakobson, B. I., Chang, W.-H., & Li, L.-J. (2020). Wafer-scale single-crystal hexagonal boron nitride monolayers on Cu (111). Nature. https://doi.org/10.1038/s41586-020-2009-2

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.