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Standardization of surface potential measurements of graphene domains

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Panchal, Vishal, Pearce, Ruth, Yakimova, Rositza, Tzalenchuk, Alexander, Kazakova, Olga·2013·Scientific Reports

Abstract

We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness. The surface potential (SP) of graphene is directly measured in Hall bar geometry via a combination of electrical functional microscopy and spectroscopy techniques, which enables calibrated work function measurements of graphene domains in ambient conditions with values Φ1LG ~4.55 ± 0.02 eV and Φ2LG ~ 4.44 ± 0.02 eV for single- and bi-layer, respectively. We demonstrate that frequency-modulated Kelvin probe force microscopy (FM-KPFM) provides more accurate measurement of the SP than amplitude-modulated (AM)-KPFM. The discrepancy between experimental results obtained by different techniques is discussed. In addition, we use FM-KPFM for contactless measurements of the specific components of the device resistance. We show a strong non-Ohmic behavior of the electrode-graphene contact resistance and extract the graphene channel resistivity.

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Metadata

Authors
Panchal, V., Pearce, R., Yakimova, R., Tzalenchuk, A., & Kazakova, O.
Venue
Scientific Reports
Published
2013-09-06
Volume
3
Issue
1
Pages
2597-2597
ISSN
2045-2322 (ISSN-L)
OpenAlex
W2145834542
Cited by
239
References
0
FWCI
8.73
Type
journal article
Language
en
Open access
gold

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CoChat. (2026). Citation check: Standardization of surface potential measurements of graphene domains. https://app.cochat.ai/papers/10.1038/srep02597
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Panchal, V., Pearce, R., Yakimova, R., Tzalenchuk, A., & Kazakova, O. (2013). Standardization of surface potential measurements of graphene domains. Scientific Reports. https://doi.org/10.1038/srep02597

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