Comparative performance of X-ray diffraction and Raman microprobe techniques for the study of carbon materials

Abstract

This paper compares the information provided by X-ray diffraction and Raman spectrometry in terms of the structural order in a wide set of carbon solids. A special emphasis is placed in checking the validity of the commonly used formula of Tuinstra and Koenig and establishing the magnitude of errors potentially derived from its application. For this, a total number of 45 carbon materials aiming to cover the whole spectrum of properties and applications of these solids were jointly characterised by X-ray diffraction and Raman microprobe spectrometry. The comparison of d 002 interlayer spacing and the ratio of D to G Raman band intensities allows one to conclude that both techniques are complementary rather than equivalent. The different types of factors affecting the D and G band intensities and widths are discussed, it being concluded that their contributions are difficult to separate. The overall conclusion is that Tuinstra and Koenig's formula is valid only as a first approximation to L a values, and that errors as high as 100% are possible, so that, whenever feasible, direct measurements by XRD are recommended.