The DOI matches its Crossref record; 25 of the 26 references it cites were found in a registry or an index.
Shape-based retrieval of industrial surface defects using angular radius Fourier descriptor
Abstract
Current industrial surface inspection systems are capable of detecting various defects and producing images of them. The defect images are collected into large image databases. Effective retrieval methods are necessary to analyse the defects stored in the database. In this work, a novel shape descriptor for surface defect image retrieval is presented. The descriptor is based on the Fourier transform of the defect boundary. The proposed method, angular radius Fourier descriptor, combines the boundary function with the directional angle of the boundary line. The proposed method outperforms ordinary Fourier descriptors in the retrieval of paper defect shapes without increasing computational cost.
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Citations
Cites
Baeza-Yates, R. A., & Ribeiro-Neto, B. A. (1999) · Cited by 11,505
Visual pattern recognition by moment invariants
Hu, M.-K. (1962) · IRE Transactions on Information Theory · doi:10.1109/tit.1962.1057692 · Cited by 7,679
Image analysis via the general theory of moments*
Teague, M. R. (1980) · Journal of the Optical Society of America · doi:10.1364/josa.70.000920 · Cited by 2,309
Review of shape representation and description techniques
Zhang, D., & Lu, G. (2003) · Pattern Recognition · doi:10.1016/j.patcog.2003.07.008 · Cited by 1,872
Introduction to MPEG-7: Multimedia Content Description Interface
Salembier, P., Sikora, T., & Manjunath, B. S. (2002) · John Wiley & Sons, Inc. eBooks · Cited by 1,170
Shape Discrimination Using Fourier Descriptors
Persoon, E., & Fu, K. (1977) · IEEE Transactions on Systems Man and Cybernetics · doi:10.1109/tsmc.1977.4309681 · Cited by 1,076
A survey of shape analysis techniques
Lončarić, S. (1998) · Pattern Recognition · doi:10.1016/s0031-2023(97)00122-2 · Cited by 967
Scale-Based Description and Recognition of Planar Curves and Two-Dimensional Shapes
Mokhtarian, F., & Mackworth, A. K. (1986) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.1986.4767750 · Cited by 856
Shape Analysis and Classification
Costa, L. D. F., & Junior, R. M. C. (2010) · CRC Press eBooks · doi:10.1201/9781420037555 · Cited by 703
Fourier Preprocessing for Hand Print Character Recognition
Granlund, G. H. (1972) · IEEE Transactions on Computers · doi:10.1109/tc.1972.5008926 · Cited by 582
Research works printed but not linked: 8
- Del Bimbo, A.: ‘Visual information tetrieval’, (Morgan Kaufmann Publishers, San Fransisco 2001)
- 10.1016/j.patcog.2003.07.008 · DOI
- Iivarinen, 1998, Proc. 14th Int. Conf. Pattern Recognition, 1
- Iivarinen, 1996, 2904, 25
- Zhang, 2003, 14, 41
- Kunttu, 2004, 2, 765
- Rauhamaa, 2002, Proc. 2002 TAPPI Technology Summit
- Kunttu, 2006, 17, 211
Cited by
A Review of Recent Advances in Surface Defect Detection using Texture analysis Techniques
Xie, X. (2008) · ELCVIA Electronic Letters on Computer Vision and Image Analysis · doi:10.5565/rev/elcvia.268 · Cited by 500
Automated Visual Defect Classification for Flat Steel Surface: A Survey
Luo, Q., Fang, X., Su, J., Zhou, J., Zhou, B., Yang, C., Liu, L., Gui, W., & Tian, L. (2020) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2020.3030167 · Cited by 148
Farthest point distance: A new shape signature for Fourier descriptors
El-ghazal, A., Basir, O., & Belkasim, S. O. (2009) · Signal Processing Image Communication · doi:10.1016/j.image.2009.04.001 · Cited by 117
Cubero, S., Diago, M. P., Blasco, J., Tardáguila, J., Millán, B., & Aleixos, N. (2013) · Biosystems Engineering · doi:10.1016/j.biosystemseng.2013.06.007 · Cited by 61
Few-shot semantic segmentation for industrial defect recognition
Shi, X., Zhang, S., Cheng, M., He, L. L., Tang, X., & Cui, Z. (2023) · Computers in Industry · doi:10.1016/j.compind.2023.103901 · Cited by 53
Metadata
- Authors
- Kunttu, I., & Lepistö, L.
- Affiliations
- Tampere University of Technology (FI)
- Institute of Signal Processing, Tampere University of Technology, P.O. Box 553, Tampere, FI-33101, Finland
- ORCID
- Kunttu, I.
- Venue
- IET Image Processing
- Published
- 2007-06-05
- Volume
- 1
- Issue
- 2
- Pages
- 231-236
- ISSN
- 1751-9659 (ISSN-L)
- 1751-9667
- OpenAlex
- W2035919971
- Cited by
- 34
- References
- 26
- Citations by year
- 2024: 1 · 2023: 1 · 2022: 1 · 2020: 1 · 2018: 1 · 2017: 1 · 2016: 3 · 2014: 1 · 2013: 3 · 2012: 5
- FWCI
- 5.68
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IET Image Processing (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Image Retrieval and Classification Techniques
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Image Processing and 3D Reconstruction
- Keywords
- shape retrieval, Fourier descriptors, paper defects, shape features, image retrieval
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review