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Cited by 440

The DOI matches its Crossref record; 10 of the 10 references it cites were found in a registry or an index.

TDD‐net: a tiny defect detection network for printed circuit boards

Open access
Ding, Runwei, Dai, Linhui, Li, Guangpeng, Liu, Hong·2019·CAAI Transactions on Intelligence Technology

Abstract

Tiny defect detection (TDD) which aims to perform the quality control of printed circuit boards (PCBs) is a basic and essential task in the production of most electronic products. Though significant progress has been made in PCB defect detection, traditional methods are still difficult to cope with the complex and diverse PCBs. To deal with these problems, this article proposes a tiny defect detection network (TDD‐Net) to improve performance for PCB defect detection. In this method, the inherent multi‐scale and pyramidal hierarchies of deep convolutional networks are exploited to construct feature pyramids. Compared with existing approaches, the TDD‐Net has three novel changes. First, reasonable anchors are designed by using k‐means clustering. Second, TDD‐Net strengthens the relationship of feature maps from different levels and benefits from low‐level structural information, which is suitable for tiny defect detection. Finally, considering the small and imbalance dataset, online hard example mining is adopted in the whole training phase in order to improve the quality of region‐of‐interest (ROI) proposals and make more effective use of data information. Quantitative results on the PCB defect dataset show that the proposed method has better portability and can achieve 98.90% mAP, which outperforms the state‐of‐arts. The code will be publicly available.

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Metadata

Authors
Ding, R., Dai, L., Li, G., & Liu, H.
Venue
CAAI Transactions on Intelligence Technology
Published
2019-05-31
Volume
4
Issue
2
Pages
110-116
ISSN
  • 2468-2322 (ISSN-L)
  • 2468-6557
OpenAlex
W2941001797
Cited by
440
References
10
FWCI
14.87
Type
journal article
Language
en
Open access
gold

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CoChat. (2026). Citation check: TDD‐net: a tiny defect detection network for printed circuit boards. https://app.cochat.ai/papers/10.1049/trit.2019.0019
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Ding, R., Dai, L., Li, G., & Liu, H. (2019). TDD‐net: a tiny defect detection network for printed circuit boards. CAAI Transactions on Intelligence Technology. https://doi.org/10.1049/trit.2019.0019

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