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Scanning probe microscopy of thermal conductivity and subsurface properties

Nonnenmacher, M., Wickramasinghe, H. K.·1992·Applied Physics Letters

Abstract

The past six years has seen a tremendous growth in scanned probe microscopies of various sorts. In this letter, we add a new capability to this family−mapping of thermal conductivity variations on a nanometer scale. We show how our new probe technique can be used to measure thermal conductivity of conductors and thin insulating films deposited on top of conductors. Our results also demonstrate for the first time, the capability of the technique to image subsurface details of samples. As the thermal conductivities of different materials can vary by over three orders of magnitude, we suggest this as an important new contrast mechanism for studying materials on the nanometer scale.

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Metadata

Authors
Nonnenmacher, M., & Wickramasinghe, H. K.
Venue
Applied Physics Letters
Published
1992-07-13
Volume
61
Issue
2
Pages
168-170
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W1994680977
Cited by
171
References
0
FWCI
1.76
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Scanning probe microscopy of thermal conductivity and subsurface properties. https://app.cochat.ai/papers/10.1063/1.108207
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Nonnenmacher, M., & Wickramasinghe, H. K. (1992). Scanning probe microscopy of thermal conductivity and subsurface properties. Applied Physics Letters. https://doi.org/10.1063/1.108207

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.