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Time-resolved optical characterization of InGaAs/GaAs quantum dots

Wang, G., Fafard, S., Leonard, D., Bowers, J. E., Merz, J. L., Petroff, P. M.·1994·Applied Physics Letters

Abstract

We report on the optical characterization of the strained InGaAs/GaAs quantum dots (QDs). The temperature dependence of the photoluminescence (PL) indicates that the onset energy of the thermal quenching in ∼20-nm-diam QDs is enhanced by a factor of ∼2 as compared to a quantum well (QW), due to the additional confinement. At low temperature, an increased carrier lifetime is observed for the QDs as compared to a reference QW (880 vs 330 ps). The carrier lifetime in the QDs was found to be independent of the temperature for T<30 K. In addition to this different dynamics of the localized excitons, we find that in the steady state PL and PL excitation, there is virtually no overlap between the emission and the absorption energies.

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Metadata

Authors
Wang, G., Fafard, S., Leonard, D., Bowers, J. E., Merz, J. L., & Petroff, P. M.
Venue
Applied Physics Letters
Published
1994-05-23
Volume
64
Issue
21
Pages
2815-2817
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2078661198
Cited by
234
References
0
FWCI
13.43
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Time-resolved optical characterization of InGaAs/GaAs quantum dots. https://app.cochat.ai/papers/10.1063/1.111434
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Wang, G., Fafard, S., Leonard, D., Bowers, J. E., Merz, J. L., & Petroff, P. M. (1994). Time-resolved optical characterization of InGaAs/GaAs quantum dots. Applied Physics Letters. https://doi.org/10.1063/1.111434

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