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Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers

Hu, Jun, Xiao, Xu-Dong, Salmeron, Miquel·1995·Applied Physics Letters

Abstract

The atomic force microscope is used to measure dielectric polarization forces on surfaces induced by a charged tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using polarization forces we have been able to image liquid films, droplets, and other weakly adsorbed material.

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Metadata

Authors
Hu, J., Xiao, X.-D., & Salmeron, M.
Venue
Applied Physics Letters
Published
1995-07-24
Volume
67
Issue
4
Pages
476-478
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2030427403
Cited by
230
References
0
FWCI
3.66
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers. https://app.cochat.ai/papers/10.1063/1.114541
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Hu, J., Xiao, X.-D., & Salmeron, M. (1995). Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers. Applied Physics Letters. https://doi.org/10.1063/1.114541

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.