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Cited by 159

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Red shift of plasmon resonance frequency due to the interacting Ag nanoparticles embedded in single crystal SiO2 by implantation

Liu, Zhengxin, Wang, Honghong, Li, Hao, Wang, Xuemei·1998·Applied Physics Letters

Abstract

A metal nanoparticle system has been prepared by 200 Kev Ag+ ion implantation into perfect single crystal SiO2 at room temperature to dose: 6.7×1016/cm2. The system presents quasidual-layer structure: the shallower implanted layer containing noninteracting small Ag nanoparticles and the deeper layer containing interacting large nanoparticles, in which great red shift, about 1 eV, comparing with the plasmon resonance frequency of the noninteracting nanoparticle, can be clearly observed. The red shift is attributed to the multipoles interaction among the high density nanoparticles at external electric field. Moreover, the magnitude of red shift increases with implanted dose.

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Metadata

Authors
Liu, Z., Wang, H., Li, H., & Wang, X.
Venue
Applied Physics Letters
Published
1998-04-13
Volume
72
Issue
15
Pages
1823-1825
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2149825984
Cited by
159
References
1
FWCI
1.96
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Red shift of plasmon resonance frequency due to the interacting Ag nanoparticles embedded in single crystal SiO2 by implantation. https://app.cochat.ai/papers/10.1063/1.121196
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Liu, Z., Wang, H., Li, H., & Wang, X. (1998). Red shift of plasmon resonance frequency due to the interacting Ag nanoparticles embedded in single crystal SiO2 by implantation. Applied Physics Letters. https://doi.org/10.1063/1.121196

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